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Automated Qualitative X-Ray Fluorescence Elemental Analysis

Published online by Cambridge University Press:  06 March 2019

Mary F. Garbauskas  and
Raymond P. Goehner
Mary F. Garbauskas
Affiliation:
General Electric Corporate Research and Development, P.O. Box 8, Schenectady, NY 12301
Raymond P. Goehner
Affiliation:
General Electric Corporate Research and Development, P.O. Box 8, Schenectady, NY 12301
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Abstract

A series of FORTRAN IV programs have been written to aid in qualitative x-ray fluorescence (XRF) analysis. These programs have been implemented on a DEC PDP 11/34 computer with an RSX-11M operating system and access the NIH elemental data base (1). The programs and their application to XRF analysis in our laboratory will be described.

Information

Type
VII. XRF Computer Systems and Mathematical Corrections
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 345 - 350
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Data base available from Charles Fiori, Room 3W13-Building 13, National Institute of Health, Bethesda, MD 20205.Google Scholar
2. Huang, T.C., Parrish, W., Ayers, G.L., Advances in X-ray Analysis 24, 407 (1981).Google Scholar
3. Platbrood, G., Serbruyns, M., Quitin, J.M., X-ray Spectrometry 11, 83 (1982).Google Scholar
4. Doyle, B.L., Chambers, W.F., Christensen, T.M., Hall, J.M. and Pepper, G.H., Sine Theta Settings for X-ray Spectrometers, Atomic Data and Nuclear Data Tables, Vol. 24, No. 5, 1979.Google Scholar
5. White, E.W., Gibbs, G.V., Johnson, G.G., Jr. and Zechman, G.R., Xray Wavelengths and Crystal Interchange Settings for Wavelength Geared Curved Crystal Spectrometers, Report of the Pennsylvania State Univ., 1964.Google Scholar
6. Bearden, J.A., X-ray Wavelengths and X-ray Atomic Energy Levels, Rev. Mod. Phys., Vol. 39, No. 73, 1967.Google Scholar
7. Bearden, J.A. and Burr, A.F, Reevaluation of X-ray Atomic Energy Levels, Rev. Mod. Phys., Vol. 31, No. 1, 1967.Google Scholar
8. Goehner, R.P., Advances in X-ray Analysis 23, 305 (1980).Google Scholar
9. Goehner, R.P., General Electric Technical Information Series, #82CRD043, 1982.Google Scholar
10. Criss, J.W., Birks, L.S., Gilfrich, J.V., Anal. Chem. 50, 33 (1978).Google Scholar
11. Criss, J.W., Advances in X-ray Analysis 23, 93 (Google Scholar