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Continuing Development of Mercuric Iodide X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

J.S. Iwanczyk ,
A.J. Dabrowski ,
G.C. Huth  and
W. Drummond
J.S. Iwanczyk
Affiliation:
University of Southern California, Institute for Physics and Imaging Science, 4676 Admiralty Way, Suite 932, Marina del Rey, CA 90231
A.J. Dabrowski
Affiliation:
University of Southern California, Institute for Physics and Imaging Science, 4676 Admiralty Way, Suite 932, Marina del Rey, CA 90231
G.C. Huth
Affiliation:
University of Southern California, Institute for Physics and Imaging Science, 4676 Admiralty Way, Suite 932, Marina del Rey, CA 90231
W. Drummond
Affiliation:
Tracor Xray Inc., Mountain View, CA 94043
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Extract

The continuing development in recent years of mercuric iodide room temperature x-ray spectrometers has led to steady improvment in the spectral energy resolution capability of these systems. This has been due largely to the continuing reduction in the electronic noise level of the associated preamplification electronics. It has been demonstrated that a system consisting of a mercuric iodide detector in combination with a pulsed-optical feedback preamplifier provides superior energy resolution performance in x-ray spectrometry in comparison to the other types of preamplification. Previously, results have been reported by us of the energy resolution of such systems with both the detector and input FET of the preamplifier at room temperature and with the input FET cooled by liquid nitrogen and the mercuric iodide x-ray detectors lightly cooled.

Type
VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 405 - 414
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Iwanczyk, J. S., Dabrowski, A. J., Huth, G. C., A. Del Duca, and Schnepple, W., IEEE Trans. on Nuclear Sci. NS-28. 1 (1981) 579.Google Scholar
2. Dabrowski, A. J., Iwanczyk, J. S., Barton, J. B., Huth, G. C., Whited, R., COrtale, Economou, T. E., and Turkevich, A. L., IEEE Trans, on Nuclear Science, NS-28. 1 (1981) 536.Google Scholar
3. Iwanczyk, J. S., Kusmiss, J. H., Dabrowski, A. J., Barton, J. B., Huth, G. C., Economou, T. E., and Turkevich, A. S., Nuclear Instruments and Methods, 193 (1982) 73.Google Scholar
4. Ames, L., Drummond, W. Iwanczyk, J. S. and Dabrowski, A. J., Advances in X-Ray Analysis, Vol. 26 (1983) 325.Google Scholar
5. Dabrowski, A. J., Iwanczyk, J. S., Szymczyk, W. M., Kusmiss, J. H., Huth, G. C., Drummond, W. and Ames, L., Nuclear Instruments and Methods, 213 (1983) 89.Google Scholar
6. Dabrowski, A. J., Advances in X-Ray Analysis, Vol. 25 (1982) 1.Google Scholar
7. Ricker, G. R., Vallerga, J. V., Dabrowski, A. J., Iwanczyk, J. S. and Entine, G., Review of Scientific Instruments, Vol. 53, No. 5 (1982) 700.Google Scholar