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Crystallite Size and Particle Size Measurements on BeO Powders by X-Ray Methods

Published online by Cambridge University Press:  06 March 2019

S. F. Bartram
S. F. Bartram*
Affiliation:
General Electric Company, Cincinnati, Ohio
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Abstract

As part of a study on the fundamental properties of BeO, the surface area, particle size, and crystallite size of BeO powders prepared from different source materials were measured. The results obtained by means of small-angle X-ray scattering and X-ray line-broadening have been compared with electron micrographs and surface area values by air permeability, nitrogen adsorption, and water-vapor adsorption.

Small-angle scattering data were analyzed to yield particle size distribution curves as well as surface areas for various calcined BeO samples. Line-broadening measurements were made to determine mean crystallite dimensions of these same materials. By using both photographic film and automatic recording techniques, crystallite sizes from about 50 to over 5000 A were estimated. The rate of growth of BeO crystals from beryllium hydroxide, beryllium sulfate, and beryllium oxalate source materials has been followed by these complementary techniques.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 4: Ninth Annual Conference on Applications of X-ray Analysis, August 10-12, 1960 , 1960 , pp. 40 - 62
Copyright
Copyright © International Centre for Diffraction Data 1960

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References

1. Rau, R. C., “X-Ray Diffraction Investigation of BeO Calculation Processes,” This volume, p. 19.Google Scholar
2. Ross, P. A., “Polarization of X-Rays,” Phys. Rev., Vol. 28, 1926, p. 425.Google Scholar
3. Guinier, A. and Fournet, G., Small-Angle Scattering of X-Rays, John Wiley and Sons, New York, 1955, p. 95.Google Scholar
4. Souies, J. A., Gordon, W. L., and Shaw, C. H., “Design of Differential X-Ray Filters for Low-Intensity Scattering Experiments,” Rev. Sci. Inst., Vol. 27, No. 1, 1956, p. 12.Google Scholar
5. Klug, H. and Alexander, L., X-Ray Diffraction Procedures, John Wiley and Sons, New York, 1954, pp. 491–538.Google Scholar
6. Jellinek, M. H., Solomon, E., and Fankuchen, I., ‘Measurement and Analysis of Small-Angle X-Ray Scattering,” Ind. & Eng. Chem., Vol. 18, No. 3, March 1946, p. 172.Google Scholar
7. Van Nordstrand, R. A. and Ml Hack, K., “Small-Angle X-Ray Scattering of Silica and Alumina Gels,” presented at the Catalysis Club, Chicago, May 1953; and R. A. Van Nordstrand and M. F. L Johnson, “Small-Angle X-Ray Scattering of Cracking Catalysts—Comparison with Adsorption Isotherms,” Paper No. 23, 12th Annual Pittsburgh “Diffraction Conference and A, C. A. Meeting, Pittsburgh, November 1959.Google Scholar
8. Debye, P. and Bueche, A. M., “Scattering by an Inhomogeneous Solid,” J. App. Phys., Vol. 20, June 1949, p. 518; and P. Debye etal., J. App. Phys., Vol, 28, June 1957, p. 679.Google Scholar
9. Carman, P. C. and Malherbe, P. le R., “Routine Measurement of Surface of Paint Pigments and Other Fine Powders,” J. Soc. Chem. Ind., Vol. 69, May 1950, p. 134–143; and “Routine Surface Measurements of Fine Powders,” j . App. Chem. (London), Vol. 1, 1951, p. 105.Google Scholar
10. Aitken, E. A., “The Sintering Characteristics of Beryllium Oxide,” Document Nos. R 60-GC-81 and R-6O-GC-82, General Electric Company, Research Laboratory, Schenectady, New York, February 1960.Google Scholar