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Energy Dispersive X-ray Diffractometry

  • Michael Mantier (a1) and William Parrish (a1)

Abstract

This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the contribution from the specimen, S, and the detector resolution function, D.

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References

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Powder Diffraction
  • ISSN: -
  • EISSN: 2631-3626
  • URL: /core/journals/powder-diffraction
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