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Experimental Procedures in X-Ray Diffraction Topography

Published online by Cambridge University Press:  06 March 2019

Stanley B. Austerman  and
J. B. Newkirk
Stanley B. Austerman
Affiliation:
Atomics International Canoga Park, California
J. B. Newkirk
Affiliation:
University of Denver Denver, Colorado
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Abstract

The quality and interpretation of diffraction topographic images are strongly dependent on. the detailed laboratory techniques that are used in making them. In this paper practical instructions are given for the preparation of Berg-Barrett and Lang topographs. It is hoped that these suggestions will enable the novice in the field of X-ray topography to produce high quality images and to interpret them with a minimum of learning time. The topics treated include adjustment of the critical conditions for attaining highest resolution, choice of radiation and the specific hkl planes to be used, conditions limiting the size of the image, cause and avoidance of image distortion, choice of photographic emulsions, plate processing for best contrast and resolution, photomicrographs of the original image, and plate preservation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 134 - 152
Copyright
Copyright © International Centre for Diffraction Data 1966

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References

1. James, R. W., in: Solid State Physics, Vol. 15, F. Seitz and D. Turnbull (eds.), Academic Press, New York, 1963, pp. 55–220.Google Scholar
2. Batterman, B. W. and Cole, H., “Dynamical Diffraction of X-rays by Perfect Crystals,” Rev. Mod. Phys. 26: 681, 1964.Google Scholar
3. Webb, W. W., in: Direct Observation of Imperfections in Crystals, J. B. Newkirk and J. H. Wernick (eds.), Interscience Publishers, Inc., New York, 1962, pp. 29–76.Google Scholar
4. Bonse, U. K., Hart, M., and Newkirk, J. B., in: Encyclopaedic Dictionary of Physics, to be published.Google Scholar
5. Amelinckx, S., “The Direct Observation of Dislocations” in: Solid State Pkysics, Vol. 6, Academic Press, New York and London, 1964.Google Scholar
6. Barrett, C. S., “A New Microscopy and Its Potentialities,” Trans. AIME 161: 15–64, 1945.Google Scholar
7. Newkirk, J. B., “The Observation of Dislocations and Other Imperfections by X-ray Extinction Contrast,” Trans. AIME 215: 483, 1959.Google Scholar
8. Barth, H., “Measuring Techniques of Parallel-Beam-Diffraction Micrography,” this volume, pp. 80-90.Google Scholar
9. Lang, A. R., “Studies of Individual Dislocations in Crystals by X-ray Diffraction Microscopy,” J. Appl. Phys. 30: 1748, 1959.Google Scholar
10. Austerman, S. B., Newkirk, J. B., and Smith, D. K., “Study of Defect Structures in BeO Single Crystals by X-Ray Diffraction Topography,” J. Appl. Phys. 36: 3815, 1965.Google Scholar