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Light Element Analysis with TXRF

Published online by Cambridge University Press:  06 March 2019

Christina Streli ,
Peter Wobrauschek  and
Hannes Aiginger
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
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Abstract

Total Reflection X-Ray Fluorescence Analysis (TXRF) has become a powerful analytical tool for trace element analysis. Because of its advantages in excitation and background reduction TXRF has been applied for the analysis of light elements (C,O,F,Na,...). A special Ge(HP) detector offering an ultra thin window in combination with a spectrometer specially designed for the requirements of light element analysis was used. Also a new windowless X-ray tube for efficient excitation of the light elements was tested. The system was checked with standard aqueous solutions; detection limits in the ng range (7 ng for O) are obtained.

Type
XII. Total Reflection XRS
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 947 - 952
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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