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A Minicomputer and Methodology for X-Ray Analysis

  • W. Parrish (a1), G. L. Ayers (a1) and T. C. Huang (a1)

Abstract

This paper outlines the use of an IBM Series/1 small computer for instrument automation and data reduction for X-ray polycrystalline diffractometry and wavelength dispersive X-ray fluorescence spectrometry. The profile fitting method is used to determine 2θ, d and relative peak and integrated intensities in diffraction, and the fundamental parameters method (LAMA program) is used for quantitative analysis of bulk and thin film samples. The methods are precise and rapid.

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1. Parrish, W., Huang, T. C. and Ayers, G. L., “Profile Fitting: A Powerful Method of Computer X-Ray Instrumentation and Analysis,” Trans. Am. Cryst. Assoc. 12, 55-73 (1976).
2. Huang, T. C. and Parrish, W., “Qualitative Analysis of Complicated Mixtures by Profile Fitting X-Ray Diffractometer Patterns,” in Barrett, C. S., Leyden, D. E., Newkirk, J. B. and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 21, p. 275288 (1978).10.1007/978-1-4613-9984-1_30
3. Parrish, W. and Huang, T. C., “Accuracy of the Profile Fitting Method for X-Ray Polycrystalline Diffractometry Proc. Symp. on Accuracy in Powder Diffraction, Nat. Bur. Standards, Washington, (1979).
4. Ayers, G. L., Huang, T. C. and Parrish, W., “High-Speed X-Ray Analysis,” J. Appl. Cryst. 11, 229233 (1978).10.1107/S0021889878013217
5. Laguitton, D. and Mantler, M., “LAMA I - A General Fortran Program for Quantitative X-Ray Fluorescence Analysis,” in McMurdie, H. F., Barrett, C. S., Newkirk, J. B. and Ruud, C. O., Editors, Advances in X-Ray Analysis, Vol. 20, p. 515528 (1977).
6. Laguitton, D. and Parrish, W., “Simultaneous Determination of Composition and Mass-Thickness of Thin Films by Quantitative X-Ray Fluoresnce Analysis,” Anal. Chem. 49, 1152-1156 (1977).10.1021/ac50016a023
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Powder Diffraction
  • ISSN: -
  • EISSN: 2631-3626
  • URL: /core/journals/powder-diffraction
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