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A Modified Diffractometer for X-ray Stress Measurements

Published online by Cambridge University Press:  06 March 2019

E. Macherauch  and
U. Wolfstieg
E. Macherauch
Affiliation:
Institut für Uerkstoff kunde I Universität Karlsruhe (TH) D-7500 Karlsruhe, West Germany
U. Wolfstieg
Affiliation:
Institut für Uerkstoff kunde I Universität Karlsruhe (TH) D-7500 Karlsruhe, West Germany
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Abstract

Usually, the classical Bragg-Brentano diffractometer arrangement is used for X-ray strain measurements. For measurements in different ψ-directions, the specimen is rotated clockwise or counter-clockwise around the diffractometer axis using a separate driving system (ω-diffractometer).During the measurements, primary and reflected X-ray beams are placed in the same plane as the normal of the specimen and the normals of the measured ﹛h,k,l﹜ -planes. However, the Bragg- Brentano principle also can he applied to strain measurements in different ψ-directions with a number of advantages if the specimen is rotated around an axis lying parallel to the diffractometer plane (ψ- diffractometer) (1). The principle, construction and characteristics of the ψ-diffractometer are described and compared with those of the ω-diffractometer.

Type
X-Ray Diffraction Stress Analysis
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 369 - 377
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

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