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Monte Carlo Simulation of Sample Scattering Effects from Homogeneous Samples Excited by Monoenergetic Photons

Published online by Cambridge University Press:  06 March 2019

J. M. Doster  and
R. P. Gardner
J. M. Doster
Affiliation:
Center for Engineering Applications of Radioisotopes, Nuclear Engineering Department, North Carolina State University, Raleigh, North Carolina 27650
R. P. Gardner
Affiliation:
Center for Engineering Applications of Radioisotopes, Nuclear Engineering Department, North Carolina State University, Raleigh, North Carolina 27650
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Abstract

The error introduced by sample scattering in EDXRF analysis is evaluated by Monte Carlo simulation. This is accomplished by deriving a Monte Carlo model capable of simulating single Compton and Rayleigh scatters from the exciting photon source and from fluorescent X rays in homogeneous samples. The model also includes primary, secondary, and tertiary fluorescence events. (1) Results are given for Ni-Fe-Cr ternary samples for various exciting energies with and without scattering and indicate that errors as large as 2% can be attributed to this effect.

Information

Type
Mathematical Methods in XRF
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 117 - 124
Copyright
Copyright © International Centre for Diffraction Data 1979

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References

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