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New Instruments for X-Ray Analysis

Published online by Cambridge University Press:  06 March 2019

Thomas C. Furnas Jr.
Affiliation:
Picker X-Ray Corporation, Picker Research Center Cleveland, Ohio
Eugene W. White
Affiliation:
Picker X-Ray Corporation, Picker Research Center Cleveland, Ohio
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Abstract

New Instruments for X-ray or neutron diffraction or for analyses by X-ray spectrographic methods are described. They incorporate a variety of new features which open a broad new scope of experimental techniques to the investigator. The diffractometer can be used with the diffraction plane either horizontal or vertical. The X-ray tube is conveniently supported by the diffractometer, allowing one to adjust the take-off angle from 0 to 10° without disturbing the precise alignment of the instrument. The 2θ angle bisecting mechanism functions throughout a 360° range and allows independent rotation (ω) of the specimen about the common axis. It is designed specifically for fully automatic remotely programed operation in addition to the usual manual modes.

The constant-potential generator is rated up to 50 ma at 50 kvcp and up to 40 ma at 60 kvcp, A monitor-type switch selects combinations of kilovolts and milliamperes in a manner such that exact reproducibility of settings is assured.

The dual-function strip-chart recorder incorporates both linear and three-cycle logarithmic slide wires so that each uses the output from the same linear rate meter.

The Integrated Radiation Analyzer consists of a pulse-height analyzer, electronic timer, high-speed sealer, precision linear ratemeter, power supply, printer, and diffractometer control. Integration of these components has made possible unique programing for X-ray analysis.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1960

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References

1. Furnas, Thomas C. Jr., Single Crystal Orienter, Instruction Manual, 1957, pp. 135-146, General Electric X-ray Department.Google Scholar