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A New Method for Evaluating X-Ray Diffraction Peak Broadening With Engineering Applications

Published online by Cambridge University Press:  06 March 2019

Masanori Kurita
Masanori Kurita*
Affiliation:
Technological University of Nagaoka Hagaoka, 940-21, Japan
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Abstract

A new method is proposed for evaluating rapidly the diffraction peak broadening by using the standard deviation of a Gaussian function approximating the diffraction peak. This value, called the Gaussian curve parameter (GCF), is given by

The use of the GCP permits rapid and nondestructive measurement of plastic strain and hardness of quenched and tempered steels with an automated X-ray stress analyzer using a personal computer. The GCP increases with increasing hardness of quenched and tempered steels. It also increases with increasing plastic strain by stretching. Furthermore, the GCP can be used for rapidly evaluating hardening of quenched steels.

Information

Type
III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 277 - 286
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

1. Kurita, M., A Statistical Analysis of X-Ray Stress Measurement by the Gaussian Curve-Fitting Method, Journal of Testing and Evaluation, Vol. 9, No.5 (1981), pp.285–291.Google Scholar
2. Kurita, M. and Hirayama, H., An Estimation of Hardness of Hardened Steels by X-Ray Diffraction Using a Gaussian Curve-Fitting Method, Journal of Testing and Evaluation, Vol.12, No,1 (1984), pp.13–19.Google Scholar
3. Kurita, M., Miyagawa, M., Sumiyoshi, M. and Sakiyawa, K., A Versatile Automated System for X-Ray Stress Measurement, J SMB International Journal, Vol.30, No.260 (1987) , pp.248–254.Google Scholar
4. Kurita, M., Ihara, I., Shinbo, M and Koguchi, H., Use of X-Ray Diffraction with the Gaussian Curve Method to Evaluate the Hardening in Quenched Steels, Journal of Testing and Evaluation, Vol.14, No.1 (1986), pp.33–39.Google Scholar