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Observation of Dislocation in α-Arsenic Single Crystals by X-Ray Diffraction Topography*

Published online by Cambridge University Press:  06 March 2019

M. N. Shetty ,
J. B. Taylor  and
L. D. Calvert
M. N. Shetty
Affiliation:
Division of Applied Chemistry, National Research Council, Ottawa, Canada
J. B. Taylor
Affiliation:
Division of Applied Chemistry, National Research Council, Ottawa, Canada
L. D. Calvert
Affiliation:
Division of Applied Chemistry, National Research Council, Ottawa, Canada
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Abstract

X-ray diffraction topographs were obtained from large arsenic single crystals. The camera employed copper Kα, radiation from a microfocus tube and an oscillating assembly of Soller slits limited the beam divergence. Reflections of the type (11) and (20) (primitive rhombohedral cell) were used to characterise dislocation Burgers vectors. The technique has been applied to arsenic single crystals grown from the vapour and from the melt. The majority of dislocations were found to belong to Burgers vectors <10>. Comparison has been made between dislocation etch pit patterns on (111) surfaces and X-ray topographs.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 12: Seventeenth Annual Conference on Applications of X-ray Analysis, August 21-23, 1968 , 1968 , pp. 151 - 164
Copyright
Copyright © International Centre for Diffraction Data 1968

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Footnotes

†

N.R.C. Postdoctoral fellow.

*

Issued as N.R.C. No.10247.

References

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