Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-19T11:21:01.537Z Has data issue: false hasContentIssue false
  • English
  • Français

On the Primary X-Ray Analyzer

Published online by Cambridge University Press:  06 March 2019

Shizuo Kimoto ,
Masayuki Sato ,
Hitoshi Kamada  and
Takuzi Ui
Shizuo Kimoto
Affiliation:
Japan Electron Optics, Laboratory Co., Ltd. Tokyo, Japan
Masayuki Sato
Affiliation:
Japan Electron Optics, Laboratory Co., Ltd. Tokyo, Japan
Hitoshi Kamada
Affiliation:
University of Tokyo Tokyo, Japan
Takuzi Ui
Affiliation:
University of Tokyo Tokyo, Japan
Get access

Abstract

The primary X-ray analyzer is used for nondestructive spectrochemical analysis of solid specimens. Accelerated electron beams bombard the specimen surface directly and generate primary X-rays which are measured in a vacuum spectrometer. The method of primary X-ray spectroscopy is superior to the fluorescence X-ray spectroscopy because (1) detectable sensitivity for such light elements as magnesium and aluminum is very high, and (2) the correction of the measured value for self-absorption of X-rays by the specimen itself is low. The performance of the instrument and applications are reported.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 508 - 514
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium,'Fluorine, Oxygen, Nitrogen, Carbon, and Boron,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 460.Google Scholar
2. Fox, J. G. M., “X-Ray Spectrometric Determination of Light Elements Using Direct Electron Excitation,” J. Inst. Metals 91: 239, 1962-63.Google Scholar
3. Spielberg, N., “Sensitivity of X-ray Spectro-chemical Analysis of Steel by Electron Excitation,” in : X-Ray Optics and X-rdy Microanalysis, Academic Press, New York, 1963.Google Scholar