Hostname: page-component-77f85d65b8-g98kq Total loading time: 0 Render date: 2026-03-29T16:14:45.175Z Has data issue: false hasContentIssue false
  • English
  • Français

Precision Lattice-Parameter Determination by Double-Scanning Diffractometry

Published online by Cambridge University Press:  06 March 2019

H. W. King  and
L. F. Vassamillet
H. W. King
Affiliation:
Mellon Institute, Pittsburgh, Pennsylvania
L. F. Vassamillet
Affiliation:
Mellon Institute, Pittsburgh, Pennsylvania
Get access

Abstract

The availability of counter-tube diffractometers which can scan both sides of the direct beam makes it possible to locate the zero-angle position by comparing peak positions measured on either side of the beam. These diffractometers may thus be used to determine accurate lattice parameters without the need of a calibrating substance. The feasibility of this method is explored by determining the lattice parameters of pure silver, and the limits of accuracy are discussed.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 78 - 85
Copyright
Copyright © International Centre for Diffraction Data 1961

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Wilson, A. J. C., “Geiger-Counter X-Ray Spectrometer-Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction Maxima,” J. Sci. Inst., Vol. 27, No. 12, December 1950, p. 321.Google Scholar
2. Parrish, W., “Results of the L.U.Cr. Precision Lattice-Parameter Project,” Acta Cryst., Vol. 13, No. 10, October 1960. p. 838.Google Scholar
3. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, 1st ed., John Wiley and Sons, New York, 1954.Google Scholar
4. Smakula, A. and Kalnajs, J., “Precision Determination of Lattice Constants With a Geiger-Counter XRay Diffractometer,” Phys. Rev., Vol. 99, No. 6, September 15, 1955, p. 1737.Google Scholar
5. Tournarie, M., “Rëglage Absolu d'un Goniomëtre a Compteur de Geiger-Miiller,” J. Phys. Radium, Vol. 15, Supp. No. 1, January 1954, p. 11A.Google Scholar
6. Otte, H. M.. “Lattice-Parameter Determinations With an X-Ray Spectrogoniometer by the Debye-Scherrer Method and the Effect of Specimen Condition,” J. Appl. Phys., Vol. 32, No. 8, August 1961, p. 1536.Google Scholar
7. Owen, E. A. and Williams, E. W., “A Low-Temperature X-Ray Qirnera,” J. Sci. Inst., Vol, 31, February 1954, p. 49.Google Scholar
8. Owen, E. A. and Roberts, E. W.. “Factors Affecting the Limit of Solubility of Elements in Copper and Silver,” Phil. Mag., Series 7, Vol. 27, March 1939, p. 294.Google Scholar
9. Hume-Rothery, W. and Reynolds, P. W., “A High-Temperature Debye-Scherrer Camera, and Its Application to the Study of the Lattice Spacing of Silver,” Proc. Roy. Soc, (London), Vol. A167, July 1938, p. 25.Google Scholar
10. Lipson, H. and Wilson, A. J. C., “The Derivation of Lattice Spacings from Debye-Scherrer Photographs,” J. Sci. Instr., Vol. 18, July 1941. p. 144.Google Scholar
11. Pike, E. R., “Counter Diffractometer–The Effect of Vertical Divergence on the Displacement and Breadth of Powder Diffraction Lines,” J. Sci. Instr., Vol. 34, September, 1957, p. 355; Vol. 36, January 1959, p. 52.Google Scholar
12. Jette, E. R. and Foote, F., “Precision Determination of Lattice Constants,” J. Chem. Phys., Vol. 3, No. 10. October 1935, p. 605.Google Scholar
13. Hill, R. B. and Axon, H. J., “Lattice Spacings of the Silver-Rich Solid Solution Containing Magnesium and Antimony,” J. Insr. Met., Vol. 85, April 1956, p. 109.Google Scholar
14. Parrish, W. and Ladell, J., “Present Status of Precision Lattice Parameter Determination by Counter Diffractcmetry,” Presented at International Meeting of I.U.Cr., August 1960, Cambridge, England, See abstract, Acta Cryst., Vol. 13, No, 12, December 1960, p, 992.Google Scholar
15. Wilson, A. J. C., “Some Problems in the Definition of Wavelengths in X-Ray Crystallography,” Z. Krist., Vol. 111, 1959, p, 471.Google Scholar