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Qualitative Phase Analysis Using an X-Ray Powder Diffractometer

Published online by Cambridge University Press:  06 March 2019

W. N. Schreiner ,
C. Surdukowski  and
R. Jenkins
W. N. Schreiner
Affiliation:
Philips Laboratories, Briarcliff Manor, H.Y. 10510
C. Surdukowski
Affiliation:
Philips Laboratories, Briarcliff Manor, H.Y. 10510
R. Jenkins
Affiliation:
Philips Electronic Instruments Inc., Mahwah, N.J. 07430
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Extract

During the past three years we have undertaken the development of a complete X-Ray Powder Diffraction, facility with the goal of fully integrating experimental and analytical procedures. Such an approach potentially offers substantially improved performance over previously existing systems by virtue of its internal self-consistency and it opens the possibility of significantly extending analytic procedures for both qualitative and quantitative analyses. Our work to date has resulted in improved performance and significant extensions in both areas, and today I will report on those advances in the area of qualitative analysis.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 91 - 97
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

1) “Control of Systematic Errors In The Computer Controlled Powder diffractometer”, Jenkins, R., Hahm, Y., Villamizar, C., Schreiner, W. H., Surdukowski, C., 29th Annual Conference On Applications of X-Ray Analysis, Denver, Colo. (1980).Google Scholar
2) See For Example “Advances Is X-Ray Diffraetometry and X-Ray Bpeetrography”, Parrish, W., Ed., Centrex Publ. Co. (1962).Google Scholar
3) “A Second Derivative Algorithm For Identification Of Peaks In Powder Diffraction Patterns”, Schreiner, W. H., Jenkins, R., Advances In X-Ray Analysis, 23, p.287 (1979).Google Scholar
4) “ A Computer Aided Search/Match System For Qualitative Powder Diffraetometry”, Jenkins, R., Hahm, Y., Pearlman, S., Schreiner, W. N., Advances In X-Ray Analysis, 23, p.279 (1979)Google Scholar
5) “A Qualitative Analysis Software Package For Use With The Computer Controlled Powder Diffractometer”, Norelco Rep. 27., pll(1980).Google Scholar
6) “A Search-Match Method For X-Ray Powder Diffraction Data”, Marquardt, R. G., Katnelson, I., Milne, G. W. A., Heller, S. R., Johnson, G. G. and Jenkins, R., J. App. Cryst., 12., p.629 (1979)Google Scholar
7) “Preliminary Report On The Design And Results Of The Second Round Rohin To Evaluate Search/Match Methods For Qualitative Powder Diffraetometry”, Jenkins, R. and Huhbard, C., Adv. X-Ray Anal., 22., p.133 (1979).Google Scholar
8) “User Guide To Data Base and Search Program (V.l8) IBM 360/370”, Johnson, G., JCPDS, Swarthmore PA. 19081 (1975).Google Scholar