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A Rapid and Precise Computer Method for Qualitative X-Ray Fluorescence Analysis

  • T. C. Huang (a1), W. Parrish (a1) and G. L. Ayers (a1)

Abstract

This paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.

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References

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1. Ayers, G. L., Huang, T. C. and Parrish, W., High Speed X-Ray Analysis, J. Appl. Cryst. 11:229 (1978).10.1107/S0021889878013217
2. Parrish, W., Huang, T. C. and Ayers, G. L., Comparison of Peak Search and Profile Fitting Methods in X-Ray Powder Diffractometry, American Crystallographic Association Meeting, Eufaula, Alabama (1980).
3. Savitsky, A. and Golay, M. J. E., Smoothing and Differentiation Data by Simplified Least Squares Procedures, Anal. Chem, 36:1627 (1964).10.1021/ac60214a047
4. Parrish, W., Ayers, G. L. and Huang, T. C., A Minicomputer and Methodology for X-Ray Analysis, Adv. X-Ray Anal, 23:313 (1980).
5. Laguitton, D. and Mantler, M., LAMA 1 - A General Fortran program for Quantitative X-Ray Fluorescence Analysis, Adv. X-Ray Anal. 20:515 (1977).
6. Laguitton, D. and Parrish, W., Simultaneous Determination of Composition and Mass-Thickness of Thin Films by Quantitative X-Ray Fluorescence Analysis, Anal. Chem. 49:1152 (1977),10.1021/ac50016a023
7. Huang, T. C., Quantitative X-Ray Fluorescence Analysis of Thin Films Using LAMA-2, to be published in X-Ray Spectrometry.
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Powder Diffraction
  • ISSN: -
  • EISSN: 2631-3626
  • URL: /core/journals/powder-diffraction
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