Hostname: page-component-76c49bb84f-c7tcl Total loading time: 0 Render date: 2025-07-09T11:28:18.527Z Has data issue: false hasContentIssue false
  • English
  • Français

Recent Developments in the Measurement of Orientation in Polymers by X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Zigraond W. Wilchinsky
Zigraond W. Wilchinsky*
Affiliation:
Esso Research and Engineering Company Linden, N. J.
Get access

Abstract

From pole figure data, the orientation of a crystallographic direction R in any reference direction Q in a sample can be quantitatively expressed by the average <cos2σ>, where σ is the angle between Q and R in a crystal. In general, <cos2σ> can be evaluated in terms of the experimental averages <cos2ϕhkl> whereϕhkl is the angle between Q and the normal to the (hkl) planes. The number of independent <cos2ϕhkl> measurements needed varies from one to five depending on the crystal system, hkl indices, and other factors discussed. Experimental techniques found useful for measuring <cos2φ> are described.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 6: Eleventh Annual Conference on Applications of X-ray Analysis, August 8-10, 1962 , 1962 , pp. 231 - 241
Copyright
Copyright © International Centre for Diffraction Data 1962

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Kuhn, W. and Grun, P., Kolloid-Z. 101: 248, 1942.Google Scholar
2. Steio, R. S., J. Polymer Sci. 34: 709, 1959.Google Scholar
3. Wilchinsky, Z. W., J. Appl. Phys. 30: 792, 1959.Google Scholar
4. Sack, R. A., J. Polymer Sci. 54: 543, 1961.Google Scholar
5. Schulz, L. G., J. Appl. Phys, 20: 1030, 1949.Google Scholar
6. Decker, B. F., Asp, E. T., and D. Harker, J. Appl. Phys. 19: 388, 1948.Google Scholar
7. Cullity, B. D. and A. Freda, J. Appl. Phys. 29: 25, 1958.Google Scholar
8. Wilchinsky, Z. W., J. Appl. Phys. 31: 1969, 1960.Google Scholar
9. Schael, G. (Unpublished work in collaboration with the writer).Google Scholar