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A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

Y. Gohshj ,
S. Aoki ,
A. Iida ,
S. Hayakawa ,
H. Yamaji  and
K. Sakurai
Y. Gohshj
Affiliation:
University of Tokyo, Tokyo, Japan
S. Aoki
Affiliation:
University of Tsukuba, Ibaraki, Japan
A. Iida
Affiliation:
National Laboratory for High Energy Physics, Ibaraki, Japan
S. Hayakawa
Affiliation:
University of Tokyo, Tokyo, Japan
H. Yamaji
Affiliation:
University of Tsukuba, Ibaraki, Japan
K. Sakurai
Affiliation:
University of Tokyo, Tokyo, Japan
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Summary

A scantling X-ray fluorescence(XRF) microprobe using WoIter type 1 optics was developed, and micro and trace element analysis was carried out using synchrotron radiation up to 10 keV as an excitation source. The design parameters of the optical system and the performance of the system, such as the beam size and the intensity, are described. The MDL obtained for Mn was 6 ppm in relative concentration and about 0.1 pg in absolute amount. The estimated spatial resolution was better than 10 um.

Type
VIII. Synchrotron Radiation and Other Applications of XRF
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 495 - 502
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

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