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The Search-Match Problem

Published online by Cambridge University Press:  06 March 2019

Monte C. Nichols  and
Quintin Johnson
Monte C. Nichols
Affiliation:
Sandia Laboratories, Livermore, California 94550
Quintin Johnson
Affiliation:
Sandia Laboratories, Livermore, California 94550
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Extract

Identification or recognition of an unknown is a problem encountered in areas as diverse as X-ray diffraction, signature and voice verification, fingerprint identification, and spectroscopy(mass), infared(IR), ultraviolat(UV), Auger). Features uniquely characteristic of the unknown, which are used in the identification process, are called the “pattern” of that unknown. In a typical identification, the one or more sub-patterns (components) making up the unknown pattern are identified by a search through a set of known (standard) patterns to yield potential matches. This searching and matching can be done sucessfully by hand, especially if the number of patterns in the file of standards is not too great. When the number of phases which consititute the unknown pattern becomes extremely large the use of computers becomes a practical necessity if the search is to be conducted in a reasonable time. A comparison of X-ray search-match approaches with each other and with search-match capabilities existing in other fields may lead to better X-ray phase identification techniques.

Type
Use of Computers in Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 273 - 278
Copyright
Copyright © International Centre for Diffraction Data 1979

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References

1. Frevel, L. K., Quantitative Matching of Powder Diffraction Patterns, in: “Advances in X-ray Analysis, Vol. 20,” Plenum Press, NY, (1976).Google Scholar
2. Johnson, G. G., Resolution of Powder Patterns, in: “Laboratory Systems and Spectroscopy,” Marcel Dekker, NY, (1977).Google Scholar
3. Nichols, M. C., A FORTRAN II Program for the Identification of X-Ray Powder Diffraction Patterns, UCRL-70078, Lawrence Livermore Laboratory, October 1966.Google Scholar
4. Burfield, M., Hauff, P. L., Van Trump, G. Jr., Nichols, M. C., A New Algorithm for Computer Search-Match Identification Techniques, 28th Annual Denver Conf., Denver, CO, 1979.Google Scholar
5. Bunge, E., Automatic Speaker Recognition by Computers, Page 23 Proceedings of the 1977 Carnahan Conference on Crime Countermeasure Univ. of Kentucky.Google Scholar
6. Wegstein, J. H., The Automated Classification and Identificaiton of Fingerprints, National Bureau of Standards PB-255-189 (1974).Google Scholar
7. Sokolow, S., Karnofsky, J., Gustafson, E. P., The Finnigan Library Search Program, Finnigan Application Report #2, July 1978.Google Scholar
8. Woodruff, H. B., Mank, M. E., Computer-Assisted Infared Spectral Interpretat ion p 34, Research and Development, August 1977.Google Scholar
9. Hanawalt, J. D., Phase Identification By X-Ray Powder Diffraction, p. 63, Vol. 20 Advances In X-Ray Analysis (1977).Google Scholar
10. Martens, M. et al, Systematic Identification of Unknown Drugs In Powder Form By Means of Ultra violet Spectrophotometry in Forensic Technology, Anal. Chem. 47-3 p 458 (1975).Google Scholar
11. Marquart, R. G., et al ., Computerized Search-Match Systems for Powder Diffraction Patterns CHIF 63, Analysis, 177th Matl. ACS. Mtg., Honolulu, HA, April 1-6, 1979.Google Scholar
12. Calvert, L. D., FIippen-Anderson, J. L., Hubbard, C. R., Johnson, Q. C., Lenhert, P. G., Nichols, M. C., Parrish, W., Smith, D. K., Smith, G. S., Snyder, R. L. Young, R. A., Standards for the Publication of Powder Patterns, Symposium on Accuracy in Powder Diffraction, National . Bureau of Standards, Washington, D.C. June 1979.Google Scholar
13. Goehner, R. P., Stang, L. D. and Hatfield, W. T., “A FORTRAN Plotting Package for 4010,” GE Report 78CRD06S, April 1978.Google Scholar
14. Nichols, M. C., Performance of the SEARCH Program (1966-1978-…) Past-Present-Future, American Cystallographic Association Meeting, Honolulu, HA, (1979).Google Scholar