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A Second Generation Automated Powder Diffractometer Control System

Published online by Cambridge University Press:  06 March 2019

Robert L. Snyder ,
Camden R. Hubbard  and
Nicolas C. Panagiotopoulos
Robert L. Snyder
Affiliation:
NYS College of Ceramics Alfred University Alfred, NY 14802
Camden R. Hubbard
Affiliation:
National Bureau of Standards Washington, D.C, 20234
Nicolas C. Panagiotopoulos
Affiliation:
JCPDS International Centre for Diffraction Data National Bureau of Standards Washington, D.C. 20234
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Abstract

The real-time x-ray powder diffractometer control system AUTO incorporates several advances in data collection and analysis. Counting procedures for selected area data collection are optimized to achieve either a preselected statistical error in minimum time or a minimum error in fixed total time. Run files are employed to greatly simplify quantitative analysis procedures and for controlling repetitive runs. External calibration curves for 20 are used to eliminate all but sample dependent aberrations to peak positions. A generalized data file structure is used to document the instrumental variables and sample parameters.

Information

Type
VI. XRD Search/Match Procedures and Automation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 245 - 260
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

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