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Suppression of X-Ray Fluorescence Background in X-Ray Powder Diffraction by a Mercuric Iodide Spectrometer

Published online by Cambridge University Press:  06 March 2019

J. Nissenbaum
Affiliation:
School of Applied Science and Technology, The Hebrew University of Jerusalem, Jerusalem 91 000, Israel
A. Levi
Affiliation:
School of Applied Science and Technology, The Hebrew University of Jerusalem, Jerusalem 91 000, Israel
A. Burger
Affiliation:
School of Applied Science and Technology, The Hebrew University of Jerusalem, Jerusalem 91 000, Israel
M. Schieber
Affiliation:
School of Applied Science and Technology, The Hebrew University of Jerusalem, Jerusalem 91 000, Israel
Z. Burshtein
Affiliation:
Nuclear Research Centre-Negev, P.O.Box 9001, Beer-Sheva 84 190, Israel
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Abstract

We have explored the merits of using a Hgl2 spectrometer as a detector in x-ray diffraction systems instead of a proportional gas counter, or a scintillation counter. The full width at half maximum energy resolution of the HgI2 spectrometer used was about 1.1 keV for the CuKα line (8.1 keV), and about 1.5 keV for the MoKα line (17.4 keV), The energy resolution was utilised to eliminate x-ray fluorescence background from powder diffraction spectra. We demonstrate the suppression of Fe x-ray fluorescence in diffraction patterns of ErFe03 obtained with a Cu x-ray tube, and of Y x-ray fluorescence in diffraction patterns of Y2O3 obtained with a Mo x-ray tube. The peak height to background ratios were improved by about an order of magnitude in both cases.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1983

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