Hostname: page-component-6bb9c88b65-x9fsb Total loading time: 0 Render date: 2025-07-24T16:00:57.665Z Has data issue: false hasContentIssue false
  • English
  • Français

Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region)

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke  and
Murray A. Tester
Burton L. Henke
Affiliation:
University of Hawaii, Honolulu, Hawaii 96822
Murray A. Tester
Affiliation:
University of Hawaii, Honolulu, Hawaii 96822
Get access

Abstract

Presented here is a report on the development of practical techniques for laboratory spectroscopy in the 5 to 150 A wavelength region as may be applied, for example, to light element and surface state analysis, high temperature plasma diagnostics and to the design and calibration of x-ray astronomy measurements.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 76 - 106
Copyright
Copyright © International Centre for Diffraction Data 1974

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Henke, B. L. and Tester, M. A., “Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region).” An Air Force Office of Scientific Research Technical Report (in preparation).Google Scholar
2. Henke, B. L. and Ebisu, E. S., “Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).” Advances in X-Ray Analysis, Vol. 17, p. 150–213, Plenum Press (1973).Google Scholar
3. Henke, B. L. and Ebisu, E. S., “Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).” U. S. Air Force Office of Scientific Research. Interim. Report No . 72–2174, 1973.Google Scholar
4. Henke, B. L. and Lent, R. E., “Some Eecent Work in Low Energy X-Ray and Electron. Analysis,” Advances in X-Ray Analysis, Vol. 12, p. 480–495, Plenum Press (1969).Google Scholar
5. Hugenberger, C. E. and Steele, W. J., “A Universal Type Pressure Controller for Thin Window Flow Proportional Counters,” Electron Probe Analysis Society of America (New Orleans, 1973).Google Scholar
6. Charles, M. W. and Cooke, B. A., “Proportional Counter Resolution,” Nucl. Instrum. Methods 61, 31–36 (1968).Google Scholar
7. Alkhazov, G. D., “Statistics of Electron Avalanches and Ultimate Resolution of Proportional Counters,” Nucl. Instrum. Methods 82, 155-165 (1970).Google Scholar
8. Musket, R. G., “Detection of Proton-Inducted Boron X-Rays with a Si (Li) Detector,” Nucl. Instrum. Methods 117, 385–389 (1971).Google Scholar
9. Henke, B. L., Perera, R. C. and Ono, E. H., “Ultrasoft X-Ray Bragg and Specular Reflection: The Effects of Anomalous Dispersion,” U. S. Air Force Office of Scientific Research Interim. Report No. 72-2174, 1974.Google Scholar
10. Liefeld, R. J., Kansely, S., Kirby, T. B. and Mott, D., “X-Ray Spectrometric Properties of Potassium Acid Phthalate Crystals,” Advances in X-Ray Analysis, Vol. 13, p. 373–381, Plenum Press (1970).Google Scholar