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Techniques of Low Energy X-Ray Spectroscopy (0.1 to 2 keV Region)

Published online by Cambridge University Press:  06 March 2019

Burton L. Henke  and
Murray A. Tester
Burton L. Henke
Affiliation:
University of Hawaii, Honolulu, Hawaii 96822
Murray A. Tester
Affiliation:
University of Hawaii, Honolulu, Hawaii 96822
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Abstract

Presented here is a report on the development of practical techniques for laboratory spectroscopy in the 5 to 150 A wavelength region as may be applied, for example, to light element and surface state analysis, high temperature plasma diagnostics and to the design and calibration of x-ray astronomy measurements.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 76 - 106
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

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