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X-Ray Diffraction Contrast from Impurity Precipitates in CdS Single Crystals

Published online by Cambridge University Press:  06 March 2019

Jun-ichi Chikawa
Jun-ichi Chikawa*
Affiliation:
NHK Broadcasting Science Research Laboratories 361, Kinuta-machi, Setagaya, Tokyo, Japan
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Abstract

Impurity-doped crystals CdS(GaGl3) have been studied by X-ray topography. Some large precipitates are formed close to the crystal surfaces by annealing at 300°C. In the symmetrical Laue case, the precipitates show circular images (30-60 μ in diameter) due to the radial strains around the precipitates which consist of two semicircles separated by a contrast-free plane parallel to the reflecting plane. The observations indicate that the strain field between the crystal surface and precipitate is not responsible for the contrast, and that the images are formed by X-rays which are deviated from the Bragg condition for the perfect region and satisfy the Bragg condition in the strain field on the inside of the precipitate. One of the semicircles is formed by the incident X-rays with larger glancing angles than the Bragg angle and the other with smaller ones. It is concluded that this contrast is due to the strain around a convex lens shaped precipitate.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 153 - 158
Copyright
Copyright © International Centre for Diffraction Data 1966

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