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X-Ray Diffraction from a 28 Attoliter Crystal Volume

Published online by Cambridge University Press:  06 March 2019

E.F. Skelton ,
J.D. Ayers ,
S.B. Qadri ,
J.Z. Hu ,
L.W. Finger  and
H.K. Mao
E.F. Skelton
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
J.D. Ayers
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
S.B. Qadri
Affiliation:
Condensed Matter and Radiation Sciences Division & Materials Science and Technology Division Naval Research Laboratory Washington, D.C. 20375-5000, USA
J.Z. Hu
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
L.W. Finger
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
H.K. Mao
Affiliation:
Geophysical Lab. & Center for High Pressure Research Carnegie Institution of Washington Washington, D.C. 20015-1305, USA
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Abstract

Metallic filaments with sub-micrometer diameters have recently been fabricated using novel materials fabrication techniques at NRL. The specimens are enshrouded in a glass sheath and all efforts to obtain structural information from these samples with conventional x-ray sources have been negative. By using synchrotron radiation on a wiggler beam line, x-ray diffraction data have been obtained from samples with diameters of 0.22, 0.09, 0.07, and 0.04 μm. The two thicker samples were found to be single crystals with a structure consistent with that of normal Bi. Single crystal diffraction peaks obtained from the 0.07 μm sample are incompatible with the Bi-1 or any other known structure of Bi. We have provisionally identified this as Bi-X.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 617 - 621
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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