Hostname: page-component-6766d58669-6mz5d Total loading time: 0 Render date: 2026-05-21T05:11:31.850Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Diffraction Topography

Published online by Cambridge University Press:  06 March 2019

U. K. Bonse ,
M. Hart  and
J. B. Newkirk
U. K. Bonse
Affiliation:
University of Münster Münster, Germany
M. Hart
Affiliation:
University of Bristol Bristol, England
J. B. Newkirk
Affiliation:
University of Denver Denver, Colorado
Get access

Abstract

In recent years, a number of experimental X-ray diffraction techniques have been developed by which a topographical display of the microscopical defects in a crystal can be obtained. This brief review of the most useful of these techniques is intended to summarize the elements of the various methods and to compare their respective features and limitations. Contrary to microradiographic methods, in which image contrast is due entirely to variations in X-ray absorption from point to point in the specimen, X-ray diffraction topography is concerned with point-topoint variations in the directions or the intensities of X-rays that have been diffracted by crystals. From these variations the defect structure of the crystal may be examined. Methods that mainly measure local variations in the direction of the diffracted beam are useful for the detection of gross misorientations such as subgrains or grains (methods of Gui nier and Tennevin, Schulz, Weissmann). Intensity mapping methods are chiefly concerned with individual defects such as dislocations, stacking faults, etc. In both groups there are experimental arrangements with both Laue-case (transmission) and Bragg-case (back reflection) geometry.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 1 - 8
Copyright
Copyright © International Centre for Diffraction Data 1966

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Guinier, A. and Tennevin, J., “Sur Deux Variantes de la Methode de Laue et leurs Applications,” Acta Cryst. 2: 133, 1949.Google Scholar
2. Schulz, L. G., “Method of Using a Fine-Focus X-Ray Tube for Examining the Surface of Single Crystals,” J. Metals 6: 1082, 1954.Google Scholar
3. Weissmann, S., “Method for the Study of Lattice Inhomogeneities Combining X-Ray Microscopy and Diffraction Analysis,” J. Appl. Phys. 27: 389, 1956.Google Scholar
4. Berg, W., “An X-Ray Method for Study of Lattice Disturbances of Crystals,” Nature. 19: 391, 1931.Google Scholar
5. Barrett, C. S., “New Microscopy and its Potentialities,” Trans, AIME 161: 15, 1945.Google Scholar
6. Honeycombe, R. W. K., “Simple Method of X-Ray Microscopy and its Application to Study of Deformed Metals,” J. Inst. Metals 80: 39, 1951.Google Scholar
7. Newkirk, J. B., “Observation of Dislocations and Other Imperfections by X-Ray Extinction Contrast,” Trans. AIME 215: 483, 1959.Google Scholar
8. Barth, H. and Hosemann, R., “Use of a Parallel Beam Transmission Method for the X-Ray Examination of Crystal Structure,” Z. Naturforsch. 13a: 792, 1958.Google Scholar
9. Bonse, U. and Kappler, E., “X-Ray Photography of the Distortion Planes of Single Dislocations in Germanium Single Crystals,” Z. Naturforsch. 13a: 348, 1958.Google Scholar
10. Bonse, U., “Zur rontgenographischen Bestimmung des Typs ein zelner versetzungen in Einkristallen,” and “X-Ray Picture of the Field of Lattice Distortions Around Single Dislocations,” in: Direct Observation of Imperfections in Crystals, edited by J. B. Newkirk and J. H. Wernick, Interscience Publishers, New York, 1962, pp. 431–460.Google Scholar
11. Kohra, M., Yoshimatsu, M., and Shimizu, J., “X-Ray Observation of Lattice Defects Using a Crystal Monochromator,” ibid., pp. 461-1-70.Google Scholar
12. Intrater, J. and Weissman, S., “An X-Ray Diffraction Method for the Study of Substructure of Crystals,” Acta Cryst. 7: 729, 1954.Google Scholar
13. Lang, A. R., “Direct Observation of Individual Dislocations by X-Ray Diffraction,” J. Appl. Phys. 29: 597, 1958; 30: 1748, 1959.Google Scholar
14. Borrmann, G., Hartwig, W., and Irmler, H., “Shadow of a Dislocation Line in X-Ray Diagrams,” Z. Naturforsch. 13a: 423, 1958.Google Scholar
15. Bonse, U., “Zum Kontrast an Versetzungen im Röntgenbild,” Z. Physih 177: 543, 1964.Google Scholar
16. Hart, M., Ph.D. Thesis, Bristol, 1963; M. Hart and A. R. Lang, 6th. Intern, Cong. Cryst., Rome, 1963, Paper 12.4.Google Scholar
17. Penning, P. and Polder, D., “Anomalous Transmission of X-Ray s in ElasticaUy Deformed Crystals,” Philips Res. Repts. 16: 419, 1961.Google Scholar
18. Bonse, U., “Starke Ablenkung von Rontgen-Wellenfeldstrahlert in elastich gebogenen Kristallen,” Z. Pkysik 177: 529, 1963.Google Scholar
19. Webb, W., “X-Ray Diffraction Topography,” J. B. Newkirk and J. H. Wernick, op. at., pp. 29-76.Google Scholar
20. Azaroff, L. V., “X-Ray Diffraction Studies of Crystal Perfection,” Progr. Solid State Chem. 1: 347, 1964.Google Scholar