Hostname: page-component-7f64f4797f-vhqbp Total loading time: 0 Render date: 2025-11-03T07:35:55.318Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Spectrometer for EXAFS Using a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

K. Taniguchi ,
K. Oka ,
N. Yamaki  and
S. Ikeda
K. Taniguchi
Affiliation:
Department of Solid-State Electronics, Osaka Electro-Communication University, Hat sumachi, Neyagawa, Osaka 572, Japan
K. Oka
Affiliation:
Department of Research, Union Giken Co., Ltd., 4081-1, Tsuda, Kirakata, Osaka 572, Japan
N. Yamaki
Affiliation:
Department of Chemistry, Osaka University, Machikaneyama, Toyonaka, Osaka 560, Japan
S. Ikeda
Affiliation:
Department of Chemistry, Osaka University, Machikaneyama, Toyonaka, Osaka 560, Japan
Get access

Extract

An active recording x-ray crystal spectrometer for extended x-ray absorption fine structure (EXAFS) has been built using a position sensitive detector of the self scanning photodiode array (SSPA) type. The SSPA detector has energy and position sensitivity for x-rays. The spectrometer was applied to the measurement for EXAFS of the several compounds in foil, powder and liquid states. The spectra can be obtained rapidly, and compare very well with other methods. We found that the SSPA detector is very useful for the measurement of EXAFS.

Information

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 177 - 180
Copyright
Copyright © International Centre for Diffraction Data 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Azaroff, L. V., Rev. Mod. Phys. 35:1012 (1963)Google Scholar
2. Sayers, D. E., Lytle, F. W. and Stern, E. A., Advances in X-Ray Analysis 13:248 (1970).Google Scholar
3. Takamura, T. et al., National Technical Report 21, No. 6, 692 (1975).Google Scholar
4. Compton, H. and Allison, S. K., X-Rays in Theory and Experiment, 2nd ed., Van Nostrand, New York (1935).Google Scholar