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Quantification Curves for Mica/Smectite Interstratifications by X-Ray Powder Diffraction

Published online by Cambridge University Press:  02 April 2024

Katsutoshi Tomita ,
Hidewo Takahashi  and
Takashi Watanabe
Katsutoshi Tomita
Affiliation:
Institute of Earth Sciences, Faculty of Science, Kagoshima University, Kagoshima 890, Japan
Hidewo Takahashi
Affiliation:
Department of Geology, Faculty of Education, Kagoshima University, Kagoshima 890, Japan
Takashi Watanabe
Affiliation:
Institute of Geoscience, Faculty of Natural Science, Joetsu University of Education, Joetsu, Niigata Prefecture, Japan
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Abstract

X-ray powder diffraction (XRD) patterns for many interstratified mica/glycolated smectites were calculated by changing combinations of probabilities and transition probabilities of two-component layers. Three basal XRD reflections, 5. l°–7.6°2θ (p1), 8.9°–10.2°2θ (p2), and 16.1°–17.2°2θ (p3) were selected for the quantification curves. A distinct relationship exists between Δ2θ, (p2–p1) and Δ2θ2 (p3–p2) which shows systematic changes with expandability at constant Reichweite values. The calculated values were plotted with Δ2θ1 and Δ2θ2 as the axes of coordinates, and quantification curves were calculated. The components and stacking parameters of mica/smectites were estimated easily using this diagram. Probabilities of existence of component layers and their transition probabilities for Reichweite (R=0) and (R=l) structures, and special cases of R=2 and R=3 structures were obtained.

Keywords

Ethylene glycolInterstratificationMica/smectiteReichweite structuresX-ray powder diffraction

Information

Type
Research Article
Information
Clays and Clay Minerals , Volume 36 , Issue 3 , June 1988 , pp. 258 - 262
Copyright
Copyright © 1988, The Clay Minerals Society

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