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Stochastic Modeling for Environmental Stress Screening

  • Ji Hwan Cha (a1) and Maxim Finkelstein (a2)
Abstract

Environmental stress screening (ESS) of manufactured items is used to reduce the occurrence of future failures that are caused by latent defects by eliminating the items with these defects. Some practical descriptions of the relevant ESS procedures can be found in the literature; however, the appropriate stochastic modeling and the corresponding thorough analysis have not been reported. In this paper we develop a stochastic model for the ESS, analyze the effect of this operation on the population characteristics of the screened items, and also consider the relevant optimization issues.

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Corresponding author
Postal address: Department of Statistics, Ewha Womans University, Seoul, 120-750, Korea. Email address: jhcha@ewha.ac.kr.
∗∗ Postal address: Department of Mathematical Statistics, University of the Free State, 339 Bloemfontein 9300, South Africa. Email address: finkelm@ufs.ac.za.
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Journal of Applied Probability
  • ISSN: 0021-9002
  • EISSN: 1475-6072
  • URL: /core/journals/journal-of-applied-probability
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