Hostname: page-component-8448b6f56d-42gr6 Total loading time: 0 Render date: 2024-04-25T06:35:45.126Z Has data issue: false hasContentIssue false

Applicability of the 1D Child–Langmuir relation for ion diode current calculation

Published online by Cambridge University Press:  25 April 2016

A.I. Pushkarev*
Affiliation:
Tomsk Polytechnic University, 2a Lenin Avenue, Tomsk 634028, Russia
Y.I. Isakova
Affiliation:
Tomsk Polytechnic University, 2a Lenin Avenue, Tomsk 634028, Russia
*
Address correspondence and reprint requests to: A.I. Pushkarev, Tomsk Polytechnic University, 2a Lenin Avenue, Tomsk 634028, Russia. E-mail: aipush@mail.ru

Abstract

The paper presents the results of the analysis of the influence of curvature of the electrons trajectory in the anode–cathode gap of an ion diode on the diode impedance and evaluation of applicability of the one-dimensional (1D) Child–Langmuir (CL) ratio for calculation of the electron current. Investigations of an ion diode with a graphite anode in self-magnetic insulation mode were carried out. Experiments were performed on the TEMP-4M ion accelerator set in a double pulse mode, with the first negative pulse (150–200 kV, 400–600 ns) followed by the second positive pulse (250–300 kV, 150 ns). The result of this study is that we have determined the boundary conditions for the applicability of 1D CL ratio for calculation of the electron current in the ion diode. It was found that the deviation of the diode current–voltage characteristics from CL ratio will be observed only with a significant change in the acceleration voltage during electron drift or when the electron drift time exceeds the transit time of ions.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Abdullin, E.N. & Bazhenov, G.P. (1984). On the mechanism of intensive gas release from the anode in electronic sources. Russ. Phys. J. 11, 56165684.Google Scholar
Bergeron, K.D. (1976). Two-species flow in relativistic diodes near the critical field for magnetic insulation. Appl. Phys. Lett. 28(6), 306308.CrossRefGoogle Scholar
Bugaev, S.P., Krenydel, Y.I. & Shanin, P.M. (1984). Electron Beams of a Wide Profile. Moscow: Energoatomizdat (in Russian).Google Scholar
Bystritskii, V.M. & Didenko, A.N. (1989). High-Power Ion Beams. New York: American Institute of Physics.Google Scholar
Bystritskii, V.M., Didenko, A.N., Krasik, Y.E. & Matvienko, V.M. (1985). Plasma Phys. 11, 10571061.Google Scholar
Bystritskii, V.M., Glushko, Yu.A., Kharlov, A.V. & Sinebryukhov, A.A. (1991). Experiments on high power ion beam generation in self-insulated diodes. Laser Part. Beams 9(3), 691698.CrossRefGoogle Scholar
Gao, Y., Qiu, A., Zhang, Z., Zhang, P., Wang, Z. & Yang, H. (2010). Research on pinching characteristics of electron beams emitted from different cathode surfaces of a rod-pinch diode. Phys. Plasma 17, 073108.CrossRefGoogle Scholar
Humphries, S. (1990). Charged Particle Beams. New York: Wiley.Google Scholar
Isakova, Yu.I. & Pushkarev, A.I. (2013). Thermal imaging diagnostics of powerful ion beams. Instrum. Exp. Tech. 56(2), 185192.CrossRefGoogle Scholar
Langmuir, I. (1913). The effect of space charge and residual gases on thermionic currents in high vacuum. Phys. Rev. 2, 4551.CrossRefGoogle Scholar
Li, L., Liu, L., Wan, H., Zhang, J., Wen, J. & Liu, Y. (2009). Plasma-induced evolution behavior of space-charge-limited current for multiple-needle cathodes. Plasma Sources Sci. Technol. 18, 015011.CrossRefGoogle Scholar
Mesyats, G.A. & Proskurovsky, D.I. (1989). Pulsed Electrical Discharge in Vacuum. New York: Springer–Verlag.CrossRefGoogle Scholar
Morozov, A.I. (2006). Introduction to Plasma Dynamics. Moscow: Fizmatlit.Google Scholar
Ottinger, P.F., Cooperstein, G. & Schumer, J.W. (2001) Self-Magnetic Field Effects on Electron Emission as the Critical Current Is Approached. Report No. 20011026 022: Naval Research Laboratory, Pulsed Power Physics Branch, Plasma Physics Division.CrossRefGoogle Scholar
Parker, R.K., Anderson, R.E. & Duncan, C.V. (1974). Plasma-induced field emission and the characteristics of high-current relativistic electron flow. J. Appl. Phys. 45(6), 2463.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Y.I. (2012 a). Circular ion diode with magnetic self-insulation. Tech. Phys. 57(2), 181187.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Y.I. (2012 b). A spiral self-magnetically insulated ion diode. Laser Part. Beams 30(03), 427433.CrossRefGoogle Scholar
Pushkarev, A.I. & Isakova, Y.I. (2013) A gigawatt power pulsed ion beam generator for industrial application. Surf. Coat. Technol. 228, S382S384.CrossRefGoogle Scholar
Pushkarev, A.I., Isakova, Y.I. & Guselnikov, V.I. (2011). Limitation of the electron emission in an ion diode with magnetic self-insulation. Phys. Plasmas 18, 083109.CrossRefGoogle Scholar
Pushkarev, A.I., Isakova, Y.I. & Khailov, I.P. (2014). The effective anode–cathode gap in an ion diode operating in a bipolar pulse regime. Tech. Phys. Lett. 40(7), 565568.CrossRefGoogle Scholar
Pushkarev, A.I., Isakova, Y.I. & Khailov, I.P. (2015). Intense ion beam generation in a diode with explosive emission cathode in self-magnetically insulated mode. Eur. Phys. J. D 69(2), 113, Article no. 40.CrossRefGoogle Scholar
Pushkarev, A.I., Isakova, Y.I., Sazonov, R.V. & Kholodnaya, G.E. (2013). Generation of Charged Particle Beams in Diodes with an Explosive-Emission Cathode. Moscow: Fizmatlit (in Russian).Google Scholar
Pushkarev, A.I., Novoselov, Yu.N. & Sazonov, R.V. (2007). Losses in a pulsed electron beam during its formation and extraction from the diode chamber of an accelerator. Instrum. Exp. Tech. 50(5), 687694.CrossRefGoogle Scholar
Renk, T.J., Harper-Slaboszewicz, V., Mikkelson, K.A., Ginn, W.C., Ottinger, P.F. & Schumer, J.W. (2014). Use of a radial self-field diode geometry for intense pulsed ion beam generation at 6 MeV on Hermes III. Phys. Plasmas 21, 123114.CrossRefGoogle Scholar
Tuszewski, M., Waganaar, W.J. & Desjarlais, M.P. (1995). Electron density measurements in a magnetically insulated ion diode. J. Appl. Phys. 77, 6188.CrossRefGoogle Scholar
Yoshikawa, T., Masugata, K., Ito, M., Matsui, M. & Yatsui, K. (1984). Planar-type self-magnetically insulated diode as a new source of intense pulsed light-ion beam. J. Appl. Phys. 56(11), 31373140.CrossRefGoogle Scholar