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Express method of estimating laser-induced surface damage threshold for optical components

Published online by Cambridge University Press:  05 August 2002

V.S. SIRAZETDINOV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
V.N. ALEKSEEV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
D.I. DMITRIEV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
A.V. CHARUKHCHEV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
V.N. CHERNOV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
V.N. KOTILEV
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
V.I. LIBER
Affiliation:
Research Institute for Complex Testing of Optoelectronic Devices, 188540, Sosnovy Bor, Leningrad region, Russia
N.N. RUKAVISHNIKOV
Affiliation:
Russian Federal Nuclear Center, 607190, Sarov, Nizhni Novgorod region, Russia

Abstract

The present measurements of the components' surface resistance to laser-induced damage has been completed to facilitate development and construction of the “Luch” laser system, a four-channel Nd-phosphate glass laser with a full output energy of E = 14–16 kJ. The study describes a method that, with a series of experimental data obtained from a single sample, allows us not only to estimate the threshold fluences, but to take into account the statistical nature of the surface damage. In a number of experimental situations this method makes it possible to estimate damaging fluences even from the result of a single exposure of the studied surface. Estimated threshold fluences for various optical elements are presented: K8 glass, experimental phosphate laser glass KGSS-0180, high-reflecting and antireflecting thin-film coating of elements. The 1.054-μm radiation pulse with half-height duration of 4 ns and the irradiation spot of ∼4 mm in diameter were used in the experiment.

Type
Research Article
Copyright
© 2002 Cambridge University Press

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