Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-19T22:38:59.026Z Has data issue: false hasContentIssue false
  • English
  • Français

High-intensity pulsed ion beam focusing by its own space charge

Published online by Cambridge University Press:  15 February 2019

X.P. Zhu ,
Q. Zhang ,
L. Ding ,
C.C. Zhang ,
Yu. Isakova Open the ORCID record for Yu. Isakova [Opens in a new window] ,
A. Prima ,
A. Pushkarev  and
M.K. Lei
X.P. Zhu
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
Q. Zhang
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
L. Ding
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
C.C. Zhang
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
Yu. Isakova
Affiliation:
Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
A. Prima
Affiliation:
Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
A. Pushkarev
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia
M.K. Lei*
Affiliation:
Surface Engineering Laboratory, School of Materials Science and Engineering and Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams (Ministry of Education), Dalian University of Technology, Dalian 116024, China
*
Author for correspondence: Yu. Isakova, Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk, Russia. E-mail: isakova_yulia@tpu.ru
Get access Rights & Permissions [Opens in a new window]

Abstract

The paper presents the results of a study on propagation and focusing of high-intensity pulsed ion beams, produced by a self-magnetically insulated diode of semi-cylindrical geometry at the TEMP-6 accelerator (120 ns, 200–250 kV). We examined the space-charge neutralization of the beam, the energy density in the focus, the divergence of the beam, and its shot-to-shot displacement in the focal plane. It is found that the concentration of low-energy electrons in the beam is 1.3–1.5 times higher than the concentration of ions. We observed additional ion focusing by its own space charge. With an increase in the density of the net negative (electrons and ions) charge of the beam from 3.6 to 9 µC/cm2, the total divergence (the sum of the beam divergence in the vertical and horizontal planes) decreases from 11.4 to 4.5°. It leads to an increase in the energy density in the focus from 4 up to 10–12 J/cm2. To increase the electrons concentration in the beam, a metal grid installed in the ion beam transport region was used.

Keywords

Beam displacementbeam divergenceenergy densityfocusingpulsed neutralized ion beamspace chargestatistical analysis of the ion beam parameters
Type
Research Article
Information
Laser and Particle Beams , Volume 36 , Issue 4 , December 2018 , pp. 470 - 476
Copyright
Copyright © Cambridge University Press 2019 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Brown Ian, G (2006) The Physics and Technology of Ion Sources. (2nd edn) Weinheim: WILEY-VCH Verlag GmbH & Co. KGaA, 396 p.Google Scholar
Bystritskii, VM and Didenko, AN (1989) High-Power Ion Beams. New York: American Institute of Physics.Google Scholar
Bystritskii, VM, Glushko, Y, Kharlov, AV and Sinebryukhov, AA (1991) Experiments on high power ion beam generation in self-insulated diodes. Laser and Particle Beams 9, 691–698.Google Scholar
Davis, HA, Bartsch, RR, Olson, JC, Rej, DJ and Waganaar, WJ (1997) Intense ion beam optimization and characterization with infrared imaging. Journal of Applied Physics 82, 3223.Google Scholar
Furman, ÉG, Stepanov, AV and Furman, NZ (2007) Ionic diode. Technical Physics 52, 621.Google Scholar
Gabоviсh, МD, Goncharov, AA, Pritskii, VYa and Protsenkо, IM (1975) in: Proceedings of 12th International Conference on Phenomena in Ionized Gases, Eindhoven, p. 287.Google Scholar
Humphries, S (1990) Charged Particle Beams. New York: Wiley, 847 p.Google Scholar
Humphries, S (1999) Principles of Charged Particle Acceleration. Albuquerque, NM: Wiley and Sons, 561 p.Google Scholar
Isakova, YI and Pushkarev, AI (2018) Visualization and analysis of pulsed ion beam energy density profile with infrared imaging. Infrared Physics and Technology 89, 140–146.Google Scholar
Isakova, YI, Prima, АI and Pushkarev, АI (2018) High-intensity pulsed ion beam composition and the energy spectrum measurements using the time-of-flight method. Laser and Particle beams 36, 210–218.Google Scholar
Langmuir, I (1913) The effect of space charge and residual gases on thermionic currents in high vacuum. The Physical Review 2, 450.Google Scholar
Masunov, ES and Samoshin, AV (2010) Beam focusing in a linear ion accelerator consisting of a periodic sequence of independently phased superconducting cavities. Technical Physics 55, 1028, 2.Google Scholar
Olson, CL (1982) Ion beam propagation and focusing. Journal of Fusion Energy 1, 309–339.Google Scholar
Paperny, VL, Chernih, AA, Astrakchantsev, NV and Lebedev, NV (2009) Ion acceleration at different stages of a pulsed vacuum arc. Journal of Physics D: Applied Physics 42, 155201–155210.Google Scholar
Proskurovsky, DI, Rotshtein, VP, Ozur, GE, Ivanov, YF and Markov, AB (2000) Physical foundations for surface treatment of materials with low energy, high current electron beams. Surface and Coatings Technology 125, 49–56.Google Scholar
Pushkarev, AI and Isakova, YI (2016) Applicability of the 1D Child-Langmuir relation for ion diode current calculation. Laser and Particle Beams 34, 368–377.Google Scholar
Reiser, M (2008) Theory and Design of Charged Particle Beams. Weinheim: WILEY-VCH Verlag GmbH & Co. KGaA, 647 p.Google Scholar
Renk, TJ, Provencio, PP, Prasad, SV, Shlapakovski, AS, Petrov, AV, Yatsui, K, Jiang, W and Suematsu, H (2004) Materials modification using intense ion beams. Proceedings of the IEEE 92.Google Scholar
Sharkov, BYu, Hoffmann, DHH, Golubev, AA and Yongtao, Z (2016) High energy density physics with intense ion beams. Matter and Radiation at Extremes 1, 28–47.Google Scholar
Stephens, WE (1946) A pulsed mass spectrometer with time dispersion. Physical Review, Proceedings of the American Physical Society 69, 691–692.Google Scholar
Yatsui, K, Sai, E, Masugata, K, Ito, M and Matsui, M (1985) Geometric focusing of intense pulsed ion beams from racetrack type magnetically insulated diodes. Laser and Particle Beams 3, 119.Google Scholar
Yushkov, GYu, Vodopyanov, АV, Nikolaev, AG, Izotov, IV, Savkin, КР, Golubev, SV and Oks, ЕМ (2014) Generation of high charge state platinum ions оn vасuum аrс plasma heated bу gyrotron radiation. Review of Scientific Instruments 85, 02В902 (1-3).Google Scholar
Zhu, XP, Lei, MK and Ma, TC (2002) Characterization of a high-intensity bipolar-mode pulsed ion source for surface modification of materials. Review of Scientific Instruments 73, 1728.Google Scholar
Zhu, XP, Ding, L, Zhang, Q, Isakova, Y, Bondarenko, Y, Pushkarev, AI and Lei, MK (2017) Generation and transportation of high-intensity pulsed ion beam at varying background pressures. Laser and Particle Beams 35, 587.Google Scholar
Zieher, KW (1984 a) Investigation of a pulsed self-magnetically B insulated ion diode. Nuclear Instruments and Methods in Physics Research 228, 161–168.Google Scholar
Zieher, KW (1984 b) Necessary condition for current neutralization of an ion beam propagating into vacuum from a self-magnetically Bθ-insulated ion diode. Nuclear Instruments and Methods 228, 169–173.Google Scholar