Hostname: page-component-848d4c4894-p2v8j Total loading time: 0 Render date: 2024-04-30T20:21:24.623Z Has data issue: false hasContentIssue false
  • English
  • Français

The pulsed laser damage sensitivity of optical thin films, thermal conductivity†

Published online by Cambridge University Press:  09 March 2009

Arthur H. Guenther  and
John K. McIver
Arthur H. Guenther
Affiliation:
Air Force Weapons Laboratory, Kirtland Air Force Base, New Mexico, 87117, USA
John K. McIver
Affiliation:
Center for Advanced Studies and Dept. of Physics and Astronomy, University of New Mexico, Albuquerque, New Mexico, 87131, USA
Get access Rights & Permissions [Opens in a new window]

Abstract

Pulsed laser induced damage of optical thin films is, in general, initiated by the absorption of laser radiation by imperfections in the films or at interfaces between film layers and/or the substrate. A heat flow analysis of this process stresses the importance that the thermal conductivity of both the thin film host and that of the substrate play in establishing the laser-induced damage threshold. Unfortunately, recent work, which will be reviewed in this presentation, indicates that the thermal conductivity of thin films can be several orders of magnitude lower than that of the corresponding material in bulk form. This situation arises as a consequence of the film structure resulting principally from the deposition process. The importance of thermal conductivity will be compared to parameters such as absorption mechanisms, film materials, composition, and other variables. Its implication for the ultimate optical strength of materials and the direction in which thin film research and processing should proceed will be highlighted.

Type
Research Article
Information
Laser and Particle Beams , Volume 7 , Issue 3 , August 1989 , pp. 433 - 441
Copyright
Copyright © Cambridge University Press 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Akhtar, S. M. J., Ristau, D. & Ebert, J. 1986 Proc. Symp. on Optical Materials for High Power Lasers, eds. Bennett, H. E., Guenther, A. H., Milan, D. and Newman, B. E., to be published.Google Scholar
Amsdern, C. A. et al. 1988 Presented at Fourth Topical Meeting on Optical Interference Coating,Tucson, AZ 12–15 April 1988.Google Scholar
Carniglia, C. K. et al. 1977 NBS Special Publication 541, 1977, eds. Glass, A. J. and Guenther, A. H..Google Scholar
Decker, D. L., Koshigoe, L. G. & Ashley, E. I. 1984 NBS Special Publication 727, 1984, eds., Bennett, H. E.Guenther, A. H., Milan, D. and Newman, B. E.Google Scholar
Goldenberg, H. & Trantor, M. A. 1952 British J. Appl. Phys. 2, 296.CrossRefGoogle Scholar
Guenther, A. H. & Glass, A. J. 1973 Laser Interactions and Related Plasma Phenomena, Vol. 3, eds. Schwartz, H. and Hora, H. (Plenum Press, New York) p. 149.Google Scholar
Jacobs, S. 1986 Lab. Laser Energy. Rev., 29, 30.Google Scholar
Kardach, J. A., Stewart, A. F. & Guenther, A. H. 1986 Proc. Symp. on Optical Materials for High Power Lasers, eds., Bennett, H. E.Guenther, A. H., Milan, D. and Newman, B. E., to be published.Google Scholar
Lange, M. R., McIver, J. K. & Guenther, A. H. 1985 Thin Solid Films 125, 143.CrossRefGoogle Scholar
Lange, M. R., McIver, J. K. & Guenther, A. H. 1985a NBS Special Publication 746, eds., Bennett, H. E.Guenther, A. H., Milan, D. and Newman, B. E..Google Scholar
Messier, R. 1987 Materials Research Laboratory, University of Pennsylvania, personal communication.Google Scholar
Ristau, D.Dang, X. C. & Ebert, J. 1984 NBS Special Publication 727, 1984, eds Bennett, H. E.Guenther, A. H., Milan, D. and Newman, B. E., NBS SP 727, 1984.Google Scholar
Swartz, E. T. & Pohl, R. O. 1987 Appl. Phys. Lett. 51, 2200.Google Scholar
Swimm, R. T. 1986 Proc. Symp. on Optical Materials for High Power Lasers, eds., Bennett, H. E.Guenther, A. H., Milan, D. and Newman, B. E., to be published.Google Scholar
Walker, T. W., Nielsen, P. E. & Guenther, A. H. 1981 IEEE J. Quant. Electron. 17, 2041.CrossRefGoogle Scholar
Walker, T. W., Nielsen, P. E. & Guenther, A. H. 1981a IEEE J. Quant. Electron. 17, 2053.CrossRefGoogle Scholar
Vandersande, J. W. & Wood, C. 1986 Contemp. Phys., 27, (2) 117 1987.CrossRefGoogle Scholar
Vedam, K. et al. 1987 Opt. Lett., 12CrossRefGoogle Scholar