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XUV emission from an elongated plasma column produced using a high-power laser with a gas puff target

Published online by Cambridge University Press:  09 March 2009

Henryk Fiedorowicz
Affiliation:
Institute of Optoelectronics, Military University of Technology, 2, Kaliskiego Str., 01–489 Warsaw, Poland
Andrzej Bartnik
Affiliation:
Institute of Optoelectronics, Military University of Technology, 2, Kaliskiego Str., 01–489 Warsaw, Poland
Mirosław Szczurek
Affiliation:
Institute of Optoelectronics, Military University of Technology, 2, Kaliskiego Str., 01–489 Warsaw, Poland
Ernst Fill
Affiliation:
Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Str. 1, D-85748 Garching, Germany
Yuelin Li
Affiliation:
Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Str. 1, D-85748 Garching, Germany
Georg Pretzler
Affiliation:
Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Str. 1, D-85748 Garching, Germany

Abstract

We report the first studies on the formation of an elongated plasma column suitable for X-ray laser experiments, using a gas puff target irradiated with a high-power laser. The gas puff targets, produced by pulsed injection of a small amount of gas from a high-pressure solenoid valve through a nozzle in the form of a slit, have been characterized by optical interferometry and X-ray backlighting. The formation of a hot plasma column up to 30-mm-long is demonstrated. The spatial uniformity of the column was monitored by means of an X-ray pinhole camera. XUV spectra measurements for SF6 gas puff targets show predominant 3–2 line of hydrogenic fluorine (λ = 8.1 nm), however, only linear increasing of its intensity with the target length was observed.

Type
Regular Papers
Copyright
Copyright © Cambridge University Press 1996

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References

REFERENCES

Bartnik, A. et al. 1995 Quantum Electron. 24, 19.CrossRefGoogle Scholar
Baumhacker, H. et al. 1993 Laser Part. Beams 11, 353.CrossRefGoogle Scholar
Borisov, A.B. et al. 1994 J. Opt. Soc. Am. B 12, 1941.CrossRefGoogle Scholar
Burnett, N.H. & Enright, G.D. 1990 IEEE J. Quantum Electron. 26, 1797.CrossRefGoogle Scholar
Chen, W. et al. 1990 In Conference on Lasers and Electro-Optics, Vol. 7 of 1990 OSA Technical Digest Series (Optical Society of America, Washington, D.C.)Google Scholar
Eder, D. C. et al. 1992 In Proc. of the 3rd International Colloquium on X-ray Lasers 1992 (IOP Publishing, Bristol), p. 177.Google Scholar
Falcone, R. W. 1992. In Proc. of the 3rd International Colloquium on X-ray Lasers 1992 (IOP Publishing, Bristol), p. 213.Google Scholar
Fiedorowicz, H. et al. 1994a In Proc. of the 4th International Colloquium on X-ray Lasers 1994 (AIP Press, New York), p. 538.Google Scholar
Fiedorowicz, H. et al. 1994b Laser and Part. Beams 12, 471.CrossRefGoogle Scholar
Fiedorowicz, H. et al. 1996 Phys. Rev. Lett. 46, 415.CrossRefGoogle Scholar
Filbert, P.C. & Kohler, D.A. 1990 J. Appl. Phys. 68, 3091.CrossRefGoogle Scholar
Filbert, P.C. et al. 1994 J. Appl. Phys. 75, 2332.Google Scholar
Khakhalin, S. Ya et al. 1995 Phys. Scripta 50, 106.CrossRefGoogle Scholar
Lemoff, B.E. et al. 1994 Opt. Lett. 19, 569.Google Scholar
Lemoff, B.E. et al. 1995 Phys. Rev. Lett. 74, 1574.CrossRefGoogle Scholar
Li, Y.M. et al. 1992 Opt. Comm. 93, 366.CrossRefGoogle Scholar
Shlyaptsev, V.N. & Gerusov, A.V. 1992 In Proc. of the 3rd International Colloquium on X-ray Lasers 1992 (IOP Publishing, Bristol), p. 195.Google Scholar