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Atomic number and crystallographic contrast images with the SEM: a review of backscattered electron techniques

  • Geoffrey E. Lloyd (a1)
Abstract

Backscattered electrons (BSE) are incident electrons reflected back from a target specimen and imaged with the scanning electron microscope (SEM). Three distinct BSE signals exist: atomic number or Z-contrast, in which composition determines image contrast; orientation contrast, in which specimen crystal structure determines image contrast; and electron channelling patterns (ECP), which are unique for a particular crystal orientation. The origins of these three signals are described, with particular attention being given to the necessary SEM operational and specimen preparation requirements. Z-contrast images are relatively simple to obtain and also have a familiar appearance such that their usage should become commonplace. ECP in comparison require subsequent interpretation which depends on the crystal structure and the relationship between crystal and specimen coordinate systems. A general solution to ECP interpretation is therefore presented, involving the construction of reference ‘ECP-maps’ over the surface of a sphere. A brief summary of the applications and potential use of the three BSE signals in the geological sciences is also given.

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Ball, M.D., and McCarthney, D.G. (1981) J. Microsc., 24, 5768
Bishop, H.E. (1966) Fourth Cong. Int. X-ray Opt. Microsc. (Orsay). Hermann, Paris, 153-8.
Bishop, H.E.(1974) In Quantitative Scanning Electron Microscopy (D. B. Holt M.D. Muir P. R. Grant, and I. M. Boswarva, eds.). Academic Press, New York, 4164.
Booker, G.R., Shaw, A.M. B., Whelan, M.J., and Hirsch, P.B. (1967) Philos. Mag., 16, 1185-91.
Christiansen, F.G. (1986) Tectonophys. 121, 175-96.
Coates, D.G. (1967) Philos. Mag., 16, 1179-84.
Cosslett, V.E., and Thomas, R.N. (1965) Brit. J. Appl. Phys., 16, 779-96.
Crompton, J.S., and Martin, J.W. (1980) Metallography,, 13, 225-34.
Davidson, D.L. (1974) Proc. 7th Ann. SEM Syrup., IITRI, Chicago, 927-34.
Davidson, D.L. (1976) J. Phys. E9, 341-3.
Davidson, D.L. (1977) Proc. lOth Ann. SEM Syrup., IITRI, Chicago, 431-6.
Davidson, D.L. (1982) J. Mater. Sci. Lett., 1, 236-8.
Duncumb, P., and Shields, P.K. (1963) Brit. J. Appl. Phys., 14, 617.
Echlin, P. (1974) Proc. 7th Ann. SEM Syrup., IITRI, Chicago, 1019.
Everhart, T.E. (1970) Proc. 3rd Stereoscan Colloquium, Morton Grove, Illinois, Kent-Cambridge Scientific, 1..
Everhart, T.E. and Thornley, R.F. M. (1960) J. Sci. Instrum., 37, 246-8.
Ferguson, C.C., Harvey, P.K., and Lloyd, G.E. (1980) Contrib. Mineral. Petrol., 75, 339-52.
Ferguson, C.C., Lloyd, G.E., and Knipe, R.J. (in press). Can. J. Earth Sci.
Fynn, G.W., and Powell, W.J. A. (1979) The Cutting and Polishing of Electro-Optic Materials. Adam Hilger Ltd., London.
Goldstein, J.I., and Yakowitz, H. (1975) Practical Scanning Electron Microscopy. Plenum, New York.
Goldstein, J.I., Newbury, D.E., Echlin, P., Joyce, D.C., Fiori, C., and Lifshin, E. (1981) Scanning Electron Microscopy and X-ray Microanalysis. Plenum, New York.
Hall, M.G. (1981) Proe. 14th Ann. SEM Symp. IITRI, Chicago, 409-22.
Hall, M.G. and Hutchinson, W.B. (1980) Metall. Mater. Technol., 12, 371-5.
Hall, M.G. and Lloyd, G.E. (1980) Can. Mineral., 18, 559-61.
Hall, M.G. (1981) Am. Mineral., 66, 362-8.
Hall, M.G. (1983) Ibid. 68, 843-5.
Hall, M.G. and Skinner, G.K. (1978) J. Phys. Ell, 1129–32.
Hall, M.G. (1981) J. Microsc., 124, 69-75.
Hatherley, M., and Hutchinson, W.B. (1979) Inst. Metall. (London) Monog. 5.
Heinrich, K.J. F. (1964) Adv. X-ray Anal., 7, 325-39.
Heinrich, K.J. F. (1966) Fourth Cong. Int. X-ray Opt. Microsc. (Orsay), Hermann, Paris, 159.
Hirsch, P.B., Howie, A., and Whelan, M.J. (1962) Philos. Mag., 7, 2095-100.
Hirsch, P.B., and Humphreys, C.J. (1970) Proc. 3rd Ann. SEM Syrup.,IITRI, Chicago, 449-55.
Hudson, D.R., Robinson, B.W., and Vigers, R.B. W. (1978) Can. Mineral., 64, 121-6.
Joy, D.C. (1974) In Quantitative Scanning Electron Microscopy (D. B. Holt, M.D. Muir, P.R. G.ant, and I. M. Boswarva, eds.). Academic Press, New York.
Joy, D.C. Booker, G.R., Fearon, E.O., and Bevis, M. (1971) Proe. 4th Ann. SEM Syrup., IITRI, Chicago, 497504.
Joy, D.C., and Newbury, D.E. (1977) Proc. lOth Ann. SEM Symp., IITRI, Chicago, 445-54.
Joy, D.C. and Davidson, D.L. (1982) J. App. Phys., 53, R81-12.
Joy, D.C. and Hazzledine, P.M. (1972) Proc. 5th Ann. SEM Symp., IITRI, Chicago, 97-103.
Kimoto, S., and Hashimoto, H. (1966) In The Electron Microprobe (T. D. McKinley K.F. J. Heinrich, and D. B. Wittry, eds.).
Krinsley, D.H., Pye, K., and Kearsley, A.T. (1983) Geol. Mao., 120, 109-14.
Lankford, J., and Davidson, D.L. (1982) J. Mater. Sci., 17, 1501-7.
Lin, P.S. D., and Becker, R.P. (1975) Proe. 8th Ann. SEM Syrup., IITRI, Chicago, 61-70.
Lloyd, G.E. (1985) Mineral. Assoc. Can. Short Course 11: Applications of Electron Microscopy in the Earth Sciences (J. C. White, ed.), 151-88.
Lloyd, G.E. and Ferguson, C.C. (1986) J. Struct. Geol., 8, 517-26.
Lloyd, G.E. and Hall, M.G. (1981) Tectonophys., 78, 687-98.
Lloyd, G.E. Cockayne, B., and Jones, D.W. (1981) Can. Mineral., 19, 505-18.
Lloyd, G.E. Ferguson, C.C., and Law, R.D. Tectonophys. (in press).
Nakagawa, S. (1986) Jeol. News 24E, 714
Newbury, D.E. (1975) Proc. 8th Ann. SEM. Symp., IITRI, Chicago.
Niedrig, H. (1978) Scannino, 1, 17-34.
Oatley, C.W. (1972) The Scannino Electron Microscope. Cambridge University Press.
Pfeffercorn, G.E. (1973) Proc. 6th Ann. SEM Symp., IITRI, Chicago, 751.
Prince, K.C., and Martin, J.W. (1979) Acta Metall., 27, 1401-8.
Pye, K. (1984) Geol. Ma9., 121, 81.
Pye, K. Krinsley, D. (1983) Nature,, 301, 412-1.
Pye, K. (1984) J. Sed. Petrol., 54, 877-88.
Robinson, B.W., and Nickel, E.G. (1979) Am. Mineral., 64, 1322-8.
Robinson, B.W., (1983) Ibid. 68, 840-2.
Robinson, V.N. E. (1973) J. Phys. D6, L1057
Robinson, V.N. E. -(1975) Proc. 8th Ann. SEM Syrup., IITRI, Chicago, 51-60.
Robinson, V.N. E. -and Robinson, B.W. (1978) Proc. llth Ann. SEM Symp., IITRI, Chicago, 595-602.
Saimoto, S., Helmstaedt, H., Kempson, D., and Schulson, E.M. (1980). Can. Mineral., 18, 251.
Sandstrom, R., Spencer, J.P., and Humphreys, C.J. (1974) J. Appl. Phys. D7, 1030-46.
Schulson, E.M. (1971) J. Mater. Sci., 12, 1071-87.
Schur, K., Blashke, R., and Pfeffercorn, G.E. (1974) Proc. 7th Ann. SEM Syrup., IITRI, Chicago, 1003-10.
Shimuzu, R., and Murata, K. (1971) Optik (Stuttgart),, 36, 59-65.
Spencer, J.P., Booker, G.R., Humphreys, C.J., and Joy, D.C. (1974) Proc. 7th Ann. SEM Syrup. IITRI, Chicago, 919-26.
Stephen, J., Smith, B.J., Marshall, D.C., and Witham, E.M. (1975) J. Phys. E8, 607-18.
Stickler, R., Hughes, C.W., and Booker, G.R. (1971) Proc. 4th Ann. SEM Syrup., IITRI, Chicago, 473-83.
Stott, D.E., Wise, M.L. H., and Hutchinson, W.B. (1975) J. Microsc., 105, 305-7.
Tchorzewski, R.M., and Hutchinson, W.B. (1978) Met. Trans.9A, 1113–24.
van Essen, C.G. (1971) Proc. 25th Ann. Meet. EMAG, Cambridge. Inst. Phys., London.
van Essen, C.G. and Schulson, E.M. (1969) J. Mater. Sci., 4, 336-9.
van Essen, C.G. and Verhoeven, J.D. (1974) J. Phys. E7, 768-9.
Schulson, E.M., and Donaghy, R.H. (1971) J. Mater. Sci., 6, 213-17.
Vicario, E., Pitaval, M., and Fontaine, G. (1971) Acta Crystallogr. A27, 1
Wells, O.C. (1970) Appl. Phys. Letters,, 16, 151-3.
Wells, O.C.(1974) Scanning Electron Microscopy McGraw-Hill, New York.
White, S.H., Shaw, H.F., and Huggett, J.M. (1984) J. Sed. Petrol., 54, 487-94.
White, S.H., Shaw, H.F., and Huggett, J.M. -Huggett, J.M., and Shaw, H.F. (1985) Mineral. Mag., 49, 413-23.
Wolf, E.D., and Everhart, T.E. (1969) Proc. 2nd Ann. SEM Syrup., I1TRI, Chicago, 43-4.
Yakowitz, H, (1974) In Quantitative Scanning Electron Microscopy (D. B. Holt M.D. Muir P.R. Gant, and M. Boswarva, eds.). Academic Press, New York.
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Mineralogical Magazine
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