Hostname: page-component-7857688df4-xdcjr Total loading time: 0 Render date: 2025-11-17T16:30:38.622Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution silicon Kβ X-ray spectra and crystal structure

Published online by Cambridge University Press:  05 July 2018

J. Purton  and
D. S. Urch
J. Purton
Affiliation:
Department of Chemistry, Queen Mary College, Mile End Road, London E1 4NS
D. S. Urch
Affiliation:
Department of Chemistry, Queen Mary College, Mile End Road, London E1 4NS
Get access Rights & Permissions [Opens in a new window]

Abstract

High-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO4 4--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kβ spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si-Kβ peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established.

Keywords

X-ray emission spectroscopysilicon Kβ X-raysilicateselectronic structurechemical bond

Information

Type
Research Article
Information
Mineralogical Magazine , Volume 53 , Issue 370 , April 1989 , pp. 239 - 244
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Brytov, I. A., Dikov, Y. P., Romashchenko, Y. N., Dolin, S. P. and Deol'skii, E. I. (1976) X-ray spectral study of silicate and aluminosilicate minerals. Izvestiya Akademii Nauk SSSR, Seriya Fizicheskaya 40, 164-9 (Eng. trans.).Google Scholar
Dodd, C. G. and Glenn, G. L. (1969) A survey of chemical bonding in silicate minerals by X-ray spectroscopy. Am. Mineral. 54, 1299-311.Google Scholar
Haycock, D. E. and Urch, D. S. (1982) Resolution enhancement for a commercial X-ray fluorescence spectrometer. J. Phys. E: Sci. Instrum. 15, 40-3.CrossRefGoogle Scholar
Myers, K. and Andermann, G. (1972) High resolution X-ray emission study of central atom-ligand bonding in phosphorus oxy anions. J. Phys. Chem. 76, 3975-82.CrossRefGoogle Scholar
Nefedov, V. I. and Fomichev, V. A. (1968) Electronic structure of tetrahedral oxyanions of elements of the third period. J. Struct. Chem. 9, 107-12.CrossRefGoogle Scholar
Robinson, K., Gibbs, G. V. and Ribbe, P. H. (1971) The structure of zircon: a comparison with garnet. Am. Mineral. 56, 782-90.Google Scholar
Taniguchi, K. (1984) Chemical-state analysis by means of soft X-ray spectroscopy II. Kβ spectra for phosphorus, sulfur and chlorine in various compounds. Bull. Chem. Soc. Japan 57, 915-20.CrossRefGoogle Scholar
Tossell, J. A. (1975) The electronic structures of silicon, aluminium and magnesium in tetrahedral coordination with oxygen from SCF-Xα MO calculations. J. Am, Chem. Soc. 97, 4840-4.CrossRefGoogle Scholar
Tossell, J. A. and Gibbs, G. V. (1976) A molecular orbital study of shared-edge distortions in linked polyhedra. Am. Mineral. 61, 287-94.Google Scholar
Tossell, J. A. and Gibbs, G. V. (1977) Molecular orbital studies of geometries and spectra of minerals and inorganic compounds. Phys. Chem. Minerals 2, 21-57.CrossRefGoogle Scholar
Tossell, J. A. and Gibbs, G. V., Vaughan, D. J. and Johnson, K. H. (1973) X-ray photoelectron, X-ray emission and UV spectra of SiO 2 calculated by the SCF Xa scattered wave method. Chem. Phys. Lett. 20, 32-34.CrossRefGoogle Scholar
Urch, D. S. (1970) The origin and intensities of low energy satellite lines in X-ray emission spectra: a molecular orbital interpretation. J. Phys. C: Solid State Phys. 3, 1275-91.CrossRefGoogle Scholar