Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-24T06:58:08.755Z Has data issue: false hasContentIssue false

A Lab-scale Spin and Angular Resolved Photoemission Spectroscopy Capability for 2D Valleytronics

Published online by Cambridge University Press:  19 December 2016

Fabio Bussolotti
Affiliation:
Institute for Material Research and Engineering (IMRE), #08-03, Innovis, 2 Fusionopolis Way, Singapore 138634
Zheng Zhang
Affiliation:
Institute for Material Research and Engineering (IMRE), #08-03, Innovis, 2 Fusionopolis Way, Singapore 138634
Hiroyo Kawai
Affiliation:
Institute for Material Research and Engineering (IMRE), #08-03, Innovis, 2 Fusionopolis Way, Singapore 138634
Kuan Eng Johnson Goh*
Affiliation:
Institute for Material Research and Engineering (IMRE), #08-03, Innovis, 2 Fusionopolis Way, Singapore 138634
Get access

Abstract

We report on the establishment of a new lab-scale experimental capability for Spin and Angular Resolved Photoemission Spectroscopy (SARPES) for the study of valleytronics related materials. The ARPES capabilities of the system were demonstrated by measurement on gold [Au(111)] and molybdenum disulphide (MoS2) single crystals and the full functionality of the spin detector was also verified. Experimental results are compared with theoretical modeling by ab-initio band structure calculations. We discuss the potential scope of measurement that this experimental setup affords for investigating spin-related properties (e.g. spin-orbit coupling, valley transport, etc.) in layered materials.

Type
Articles
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Xu, X., Yao, W., Xiao, D., and Heinz, T., Nat. Phys. 10, 343, (2014)Google Scholar
Zhu, Z. Y., Cheng, Y. C., and Schwingenschlogl, U., Phys. Rev. B 84, 153402 (2011).Google Scholar
Damascelli, A., Hussain, Z., and Shen, Z.X., Rev. Mod. Phys. 75, 473 (2013).CrossRefGoogle Scholar
Reinert, F., Nicolay, G., Schmidt, S., Ehm, D., and Hüfner, S., Phys. Rev. B 63, 115415 (2001).Google Scholar
Gay, T.J., and Dunning, F.B., Rev. Sci. Instrum. 63, 1635 (1992).Google Scholar
Suzuki, R., et al., Nat. Nanotechnol. 9, 611 (2014).Google Scholar
Kresse, G. and Hafner, J., Phys. Rev. B 47, 558 (1993).Google Scholar
Heyd, J., Scuseria, G. E., and Ernzerhof, M., J. Chem. Phys. 118, 8207 (2003).Google Scholar
Yun, W. S., Han, S. W., Hong, S. C., Kim, I. G., and Lee, J. D., Phys. Rev. B 85, 033305 (2012).CrossRefGoogle Scholar
Hasan, M. Z., and Kane, C. L., Rev. Mod. Phys. 82, 3045 (2010).Google Scholar
Schmitt, F. et al. ., New J. Phys. 13, 063022 (2011).CrossRefGoogle Scholar