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Synergy of Resonant Oscillatory Modes in Atomic Force Microscopy of Polymers

Published online by Cambridge University Press:  18 May 2016

Sergei Magonov ,
Sergey Belikov ,
John Alexander  and
Marko Surtchev
Sergei Magonov*
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
Marko Surtchev
Affiliation:
NT-MDT Development Inc., 7910 S. Kyrene Rd, Tempe, AZ 85284, U.S.A.
*
*(Email: magonov@ntmdt.us)
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Abstract

The set of oscillatory resonance AFM modes is expanded with frequency modulation mode and frequency imaging in amplitude modulation mode. The backgrounds of these modes are discussed and their capabilities are compared on the practical examples. The data show how these techniques complement the amplitude modulation with phase imaging. The frequency imaging enhances the compositional mapping of heterogeneous samples. Frequency modulation mode provides a superior capability in imaging at low tip-sample forces.

Keywords

scanning probe microscopy (SPM)polymernanostructure

Information

Type
Articles
Information
MRS Advances , Volume 1 , Issue 25: Theory, Characterization, and Modeling , 2016 , pp. 1853 - 1858
Copyright
Copyright © Materials Research Society 2016 

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References

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