1Hornbeck L.J., Howell T.R., Knipe R.L., and Mignardi M.A., in Microelectronic Systems 1997, DSC-Vol. 62 (American Society of Mechanical Engineers, New York, 1997) p.3.
2Texas Instruments Technical Journal (special DLPTM technology issue) 15 (3)(1998), available online at www.dlp.com/dlp/resources/over_ TITJ.asp, then click on the title of interest to download the file in PDF format: L.J. Hornbeck, “From Cathode Rays to Digital Micromirrors: A History of Electronic Projection Display Technology,” p.7; M.A. Mignardi, “From ICs to DMDs,” p.56; R.E. Meier, “DMD Pixel Mechanics Simulation,” p.64; H. Chu, A. Gonzalez, T. Oudal, R. Aldridge, D. Dudasko, and P. Barker, “DMD Superstructure Characterizations,” p.75; J.Faris and T. Kocian, “DMD Packages—Evolution & Strategy,” p.87; M. Douglass and A. Sontheimer, “Identifying and Eliminating DLPFailure Modes through Accelerated Stress Testing,” p.128.
3Kessel P.F. van, Hornbeck L.J., Meier R.E., and Douglass M.R., in Proc. IEEE 86 (1998) p.1687. Good review of DMD operation, micro-mirror dynamics, manufacturing, reliability, optical system design, and system electronics.
4Douglass M.R., in Proc. 1998 IEEE Int. Reliability Physics Symp. (Institute of Electrical and Electronics Engineers, Piscataway, NJ, 1998) p.9.
5Mignardi M.A., Gale R.O., Dawson D.J., and Smith J.C., in MEMS and MOEMS Technologies and Applications, Vol. PM85, edited by Rai-Choudhury P. (SPIE Press, Bellingham, WA, 2000) p.169.
6Bang C., Bright V., Mignardi M.A., Kocian T., and Monk D., in MEMS and MOEMS Technologies and Applications, Vol. PM85, edited by Rai-Choudhury P. (SPIE Press, Bellingham, WA, 2000) p.331.