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Movie-mode dynamic electron microscopy

Published online by Cambridge University Press:  13 January 2015

Thomas LaGrange
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; lagrange@phaseplate.com.
Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; bryan@phaseplate.com
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; dan@phaseplate.com
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Abstract

The need to understand fast, complex physical phenomena through direct insitu observation has spurred the development ofhigh-time-resolution transmission electron microscopy (TEM). Two complementaryapproaches have emerged: the single-shot and stroboscopic techniques.Single-shot TEM has advanced through the development of dynamic transmissionelectron microscopy (DTEM) and, more recently, by the advent of movie-mode DTEM,which enables high-frame-rate in situ TEM experimentation bycapturing nanosecond-scale sequences of images or diffraction patterns. PreviousDTEM studies produced only single snapshots of fast material processes.Movie-mode DTEM provides the ability to track the creation, motion, andinteraction of individual defects, phase fronts, and chemical reaction fronts,providing invaluable information on the chemical, microstructural, andatomic-level features that govern rapid material processes. This articlediscusses movie-mode DTEM technology, its application in the study of reactiondynamics in Ti–B-based reactive nanolaminates, and futureinstrumentation.

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Type
Research Article
Copyright
Copyright © Materials Research Society 2015 

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