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Relations Between Basic Nuclear Data and Single-Event Upsets Phenomena

Published online by Cambridge University Press:  31 January 2011

Jan Blomgren ,
Bo Granbom ,
Thomas Granlund  and
Nils Olsson
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Abstract

This article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) are measured over the neutron energy range of 20–150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron–nucleus spallation reactions.

Keywords

microelectronicsnuclear datasingle-event upsets

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Type
Research Article
Information
MRS Bulletin , Volume 28 , Issue 2: Single-Event Upsets in Microelectronics , February 2003 , pp. 121 - 125
Copyright
Copyright © Materials Research Society 2003

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