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Scanning probes for new energy materials: Probing local structure and function

  • Nina Balke (a1), Dawn Bonnell (a1), David S. Ginger (a1) and Martijn Kemerink (a1)
Abstract
Abstract

The design and control of materials properties, often at the nanoscale, are the foundation of many new strategies for energy generation, storage, and efficiency. Scanning probe microscopy (SPM) has evolved into a very large toolbox for the characterization of properties spanning size scales from hundreds of microns to nanometers. Recent advances in SPM involve properties and size scales of precise relevance to energy-related materials, as presented in this issue. These advances are put into the general context of energy research, and the general principles are summarized.

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1.International Energy Outlook 2011 (DOE/EIA-0484, 2011); www.eia.gov/forecasts/ieo/pdf/0484(2011).pdf.
2.Bonnell D.A. Ed., Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications (Wiley, NY, 2000).
3.Meyer E., Hug H.J., Bennewitz R., Scanning Probe Microscopy: The Lab on a Tip (Springer, Berlin, 2004).
4.Groves C., Reid O.G., Ginger D.S., Acc. Chem. Res. 43, 612 (2010).
5.Guo Q., Ford G.M., Hillhouse H.W., Agrawal R., Nano Lett. 9, 3060 (2009).
6.Guo Q., Ford G.M., Yang W.C., Walker B.C., Stach E.A., Hillhouse H.W., Agrawal R., J. Am. Chem. Soc. 132, 17384 (2010).
7.Luque A., Marti A., Nozik A.J., MRS Bull. 32, 236 (2007).
8.Grätzel M., MRS Bull. 30, 23 (2005).
9.Davis J.J., Morgan D.A., Wrathmell C.L., Axford D.N., Zhao J., Wang N., J. Mater. Chem. 15, 2160 (2005).
10.Rao A.M., Ji X., Tritt T.M., MRS Bull. 31, 218 (2006).
11.Osterloh F.E., Parkinson B.A., MRS Bull. 36, 17 (2011).
12.Atwater H., MRS Bull. 36, 57 (2011).
13.Kim M.G., Cho J., Adv. Funct. Mater. 19, 1497 (2009).
14.Simon P., Gogotsi Y., Nat. Mater. 7, 845 (2008).
15.Haruta M., Date M., Appl. Catal., A 222, 427 (2001).
16.Lanyi S., Hruskovic M., J. Phys. D-Appl. Phys. 36, 598 (2003).
17.Sadewasser S., Abou-Ras D., Azulay D., Baier R., Balberg I., Cahen D., Cohen S., Gartsman K., Ganesan K., Kavalakkatt J., Li W., Millo O., Rissom Th., Rosenwaks Y., Schock H.-W., Schwarzman A., Unold T., Thin Solid Films 519, 7341 (2011).
18.Freitag M., Kalinin S., Bonnell D., Johnson A.T., Phys. Rev. Lett. 89, 216801 (2002).
19.Bonnell D., ACS Nano 2, 1753 (2008).
20.Brukman M.J., Bonnell D.A., Phys. Today 61, 36 (2008).
21.Wiesendanger R., Scanning Probe Microscopy and Spectroscopy: Methods and Applications (Cambridge University Press, UK, 1994).
22.Nonnenmacher M., O’Boyle M.P., Wickramasinghe H.K., Appl. Phys. Lett. 58, 2921 (1991).
23.Martin Y., Abraham D.W., Wickramasinghe H.K., Appl. Phys. Lett. 52, 1103 (1988).
24.Stern J.E., Terris B.D., Mamin H.J., Rugar D., Appl. Phys. Lett. 53, 2717 (1988).
25.Sadewasser S., Glatzel Th., Eds., Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer, NY, 2012).
26.Kitamura S., Suzukia K., Iwatsukia M., Mooney C.B., Appl. Surf. Sci. 157, 222 (2000).
27.Enevoldsen G.H., Glatzel T., Christensen M.C., Lauritsen J.V., Besenbacher F., Phys. Rev. Lett. 100, 236104 (2008).
28.Gruverman A., Auciello O., Tokumoto H., J. Vac. Sci. Technol., B 14, 602 (1996).
29.Buscaglia M.T., Buscaglia V., Viviani M., Petzelt J., Savinov M., Mitoseriu L., Testino A., Nanni P., Harnegea C., Zhao Z., Nygren M., Nanotechnology 15, 1113 (2004).
30.Gruverman A., Auciello O., Ramesh R., Tokumoto H., Nanotechnology 8, A38 (1997).
31.Noda K., Ishida K., Kubono A., Horiuchi T., Yamada H., Matsushige K.Jpn. J. Appl. Phys., Part 1 40, 4361 (2001).
32.Rodriguez B.J., Jesse S., Kalinin S.V., Kim J., Ducharme S., Fridkin V.M.Appl. Phys. Lett. 90, 122904 (1007).
33.Kalinin S.V., Rodriguez B.J., Jesse S., Thundat T., Gruverman A., Appl. Phys. Lett. 87, 053901 (2005).
34.Rodriguez B.J., Callahan C., Kalinin S.V., Proksch R., Nanotechnology 18, 475504 (2007).
35.Jesse S., Kalinin S.V., Proksch R., Baddorf A.P., Rodriguez B.J., Nanotechnology 18, 435503 (2007).
36.Balke N., Jesse S., Kim Y., Adamczyk L., Tselev A., Ivanov I.N., Dudney N.J., Kalinin S.V., Nano Lett. 10, 3420 (2010).
37.Balke N., Jesse S., Morozovska A.N., Eliseev E., Chung D.W., Kim Y., Adamczyk L., Garcia R.E., Dudney N.J., Kalinin S.V., Nat. Nanotechnol. 5, 749 (2010).
38.Kumar A., Ciucci F., Morozovska A.N., Kalinin S.V., Jesse S., Nat. Chem. 3, 707 (2011).
39.Nikiforov M., Schneider S., Park T.-H., Milde P., Zerweck U., Loppacher C., Eng L., Therien M.J., Engheta N., Bonnell D., J. Appl. Phys. 106, 114307 (2009).
40.Shao R., Kalinin S., Bonnell D.A., Appl. Phys. Lett. 82, 1869 (2003).
41.Jaramillo T.F., Jørgensen K.P., Bonde J., Nielsen J.H., Horch S., Chorkendorff I., Science 317 100 (2007).
42.Chan C.K., Peng H., Liu G., McIlwrath K., Zhang X.F., Huggins R.A., Cui Y., Nat. Nanotechnol. 3, 31 (2008).
43.Rice A.H., Giridharagopal R., Zheng S.X., Ohuchi F.S., Ginger D.S., Luscombe C.K., ACS Nano 5 (4), 3132 (2011).
44.Martín-González M., Snyder G.J., Prieto A.L., Gronsky R., Sands T., Stacy A.M., Nano Lett. 3 (7), 973 (2003).
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MRS Bulletin
  • ISSN: 0883-7694
  • EISSN: 1938-1425
  • URL: /core/journals/mrs-bulletin
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