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Ultrabright and monochromatic nanowire electron sources

Published online by Cambridge University Press:  10 July 2017

Han Zhang ,
Jie Tang ,
Jinshi Yuan  and
Lu-Chang Qin
Han Zhang
Affiliation:
Advanced Low-Dimensional Materials Laboratory, National Institute for Materials Science, Japan; zhang.han@nims.go.jp
Jie Tang
Affiliation:
Advanced Low-Dimensional Materials Laboratory, National Institute for Materials Science, Japan; tang.jie@nims.go.jp
Jinshi Yuan
Affiliation:
Advanced Low-Dimensional Materials Laboratory, National Institute for Materials Science, Japan; yuan.jinshi@nims.go.jp
Lu-Chang Qin
Affiliation:
Department of Physics and Astronomy, The University of North Carolina at Chapel Hill, USA; lcqin@unc.edu
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Abstract

The resolution of the electron microscope is now largely limited by the performance of its electron source when various aberrations in the electron imaging system, especially spherical aberrations, are corrected. A nanowire tip could be an ideal point electron source, where electrons are emitted from a small physical area. In this article, we review recent advances in electric-field-induced electron emission using a single nanowire, specifically, single-crystalline lanthanum hexaboride (LaB6) nanowire, compared to the state-of-the-art contemporary tungsten cold-field electron emitter W(310) as well as single atom tip and single-carbon nanotube emitters. Owing to its low work function, improved emission stability, and high emission brightness, the LaB6 nanowire as a cold-field-emission electron source offers a new and exciting opportunity for developing the next generation of electron microscopes.

Keywords

lanthanidenanostructurescanning electron microscopy (SEM)transmission electron microscopy (TEM)
Type
Research Article
Information
MRS Bulletin , Volume 42 , Issue 7: Electron-Emission Materials , July 2017 , pp. 511 - 517
Copyright
Copyright © Materials Research Society 2017 

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