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Ultrafast Fourier transform inelastic x-ray scattering

Published online by Cambridge University Press:  10 July 2018

Mariano Trigo
Mariano Trigo*
Affiliation:
Stanford University PULSE Institute; and SIMES, SLAC National Accelerator Laboratory, USA; mtrigo@slac.stanford.edu
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Abstract

Over the past few years, x-ray free-electron lasers (FELs) have demonstrated the possibility for probing materials with femtosecond time resolution and Angstrom spatial sensitivity. Here, we review a novel development of Fourier transform inelastic x-ray scattering (FT-IXS), which exploits the ultrafast pulses from an FEL to capture frozen snapshots of the lattice vibrations at multiple length scales simultaneously, as they oscillate when excited by a short laser pulse. This article includes an overview of the principle behind this method and a review of recent work that uses this technique to access microscopic, wave vector-dependent information on how electrons couple to the lattice and to capture phonon–phonon scattering events in real time.

Keywords

x-ray diffraction (XRD)nanoscaleneutron scatteringelectron–phonon interactions
Type
Ultrafast Imaging of Materials Dynamics
Information
MRS Bulletin , Volume 43 , Issue 7: Ultrafast Imaging of Materials Dynamics , July 2018 , pp. 520 - 526
Copyright
Copyright © Materials Research Society 2018 

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