Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-30T03:08:29.348Z Has data issue: false hasContentIssue false

Amorphous Silicon TFTs on Steel-Foil Substrates

Published online by Cambridge University Press:  10 February 2011

S. D. Theiss
Affiliation:
Princeton University, Department of Electrical Engineering, Princeton, New Jersey 08544
S. Wagner
Affiliation:
Princeton University, Department of Electrical Engineering, Princeton, New Jersey 08544
Get access

Abstract

We describe the successful fabrication of device-quality a-Si:H thin-film transistors (TFTs) on stainless-steel foil substrates. These TFTs demonstrate that transistor circuits can be made on a flexible, non-breakable substrate. Such circuits could be used in reflective or emissive displays, and in other applications that require rugged macroelectronic circuits.

Two inverted TFT structures have been made, using 200 gim thick stainless steel foils with polished surfaces. In the first structure we used the substrate as the gate and utilized a homemade mask set with very large feature sizes: L = 45 μm; W = 2.5 mm. The second, inverted staggered, structure used a 9500 Å a-SiNx:H passivating/insulating layer deposited on the steel to enable the use of isolated gates. For this structure we used a mask set which is composed of TFTs with much smaller feature sizes. Both TFT structures exhibit transistor action. Current-voltage characterization of the TFTs with the inverted staggered structure shows typical on/off current ratios of 107, leakage currents on the order of 10-12 A, good linear and saturation current behavior, and channel mobilities of 0.5 cm2/V·sec. These characteristics clearly identify the TFTs grown on stainless steel foil as being of device quality.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moffatt, D. M., MRS Bulletin, 21(3), 31 (1996).Google Scholar
2. Nath, P. and Izu, M., Conf Rec. 18th IEEE Photovoltaic Specialist Conf., Las Vegas, Oct. 21–25, 1985. IEEE, New York, 1985, p. 939.Google Scholar
3. Sze, S. M., Semiconductor Devices, (Wiley, New York, 1985), p. 206.Google Scholar
4. Gupta, M., Rathi, V. K., Thangaraj, R., 0. Agnihotri, P. and Chari, K. S., Thin Solid Films, 204, 77 (1991).Google Scholar
5. Sherman, S. (private communication).Google Scholar