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An Exploration of Microscopy for Educational Applications in the High School Classroom

Published online by Cambridge University Press:  26 February 2011

Ryan Fitzsimmons
Affiliation:
fitzsimmonr1@southernct.edu, Southern Connecticut State University, Physics, United States
Robert Koekkoek
Affiliation:
rskoekkoek@charter.net, Southern Connecticut State University, Physics, United States
Christine Caragianis-Broadbridge
Affiliation:
broadbridge@southernct.edu, Southern Connecticut State University, Physics, 501 Crescent Street, JE119, New Haven, CT, 06515-1355, United States, 203-392-6461, 203-392-6466
Ann Hein Lehman
Affiliation:
lehmana1@southernct.edu, Southern Connecticut State University, Physics, United States
Karen Cummings
Affiliation:
cummingsk2@southernct.edu, Southern Connecticut State University, Physics, United States
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Abstract

This project was initiated with an undergraduate student’s exploration of two advanced research tools: the scanning electron microscope (SEM) and the atomic force microscope(AFM). A research project was developed to study the application of microscopy to introductory physics instruction. Nine modules covering various aspects of introductory physics were created. Module components included discussions, laboratory experiments and assessments. Four of the nine modules were implemented in various high school classes. Assessments were used to compare student learning with the modules versus standard textbook/lecture techniques. Preliminary results of this study are presented along with recently developed methods created to facilitate implementation of these modules within the high school classroom.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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