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Double Crystal Synchrotron X-Ray Diffraction Study of Stoichiometry in Gallium Arsenide

Published online by Cambridge University Press:  28 February 2011

S. Cockerton ,
G.S. Green  and
B.K. Tanner
S. Cockerton
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
G.S. Green
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
B.K. Tanner
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K
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Abstract

The integrated X-ray diffraction intensities of quasi-forbidden reflections in gallium arsenide, such as the 002, are particularly sensitive to stoichiometry variations. We show here that the integrated intensity as a function of wavelength exhibits a minimum whose position is dependent on the stoichiometry. Using synchrotron radiation to tune the wavelength, we have performed measurements on a horizontal Bridgman grown crystal. A shift in the minimum is observed between measurements made from different parts of the sample consistent with arsenic loss at the surface of the crystal.

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