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Electrostatic Force Microscopy of Nanofibers and Carbon Nanotubes: Quantitative Analysis Using Theory and Experiment

Published online by Cambridge University Press:  01 February 2011

Sujit Sankar Datta ,
Cristian Staii ,
Nicholas J. Pinto ,
Douglas R. Strachan  and
AT Charlie Johnson
Sujit Sankar Datta
Affiliation:
sdatta2@sas.upenn.edu, University of Pennsylvania, Physics and Astronomy, 2121 Market Street, Apartment 224, Philadelphia, PA, 19103, United States
Cristian Staii
Affiliation:
cstaii@wisc.edu, University of Wisconsin, Madison, Department of Physics, Madison, WI, 53706, United States
Nicholas J. Pinto
Affiliation:
nj_pinto@uprh.edu, University of Puerto Rico, Department of Physics and Electronics, Humacao, 00791-4300, Puerto Rico
Douglas R. Strachan
Affiliation:
drstrach@sas.upenn.edu, University of Pennsylvania, Department of Physics and Astronomy, Philadelphia, PA, 19104, United States
AT Charlie Johnson
Affiliation:
cjohnson@physics.upenn.edu, University of Pennsylvania, Department of Physics and Astronomy, Philadelphia, PA, 19104, United States
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Abstract

Electrostatic force microscopy (EFM) is a widely used scanning-probe technique for the characterization of electronic properties of nanoscale samples without the use of electrical contacts. Here we review the basic principles of EFM, developing a quantitative framework by which EFM measurements of extended nanostructures can be understood. We support our calculations with experimental data of EFM of carbon nanotubes and conducting or insulating electrospun polyaniline-based nanofibers. Furthermore, we explore routes towards extending EFM as a means of non-invasively probing the local electronic density of states of carbon nanotubes.

Keywords

scanning probe microscopy (SPM)electrical propertiesnanostructure

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References

1. Staii, C., Pinto, N. J., and Johnson, A. T., Nano Lett. 4, 859 (2004).Google Scholar
2. Staii, C., Chen, M., Gelperin, A. and Johnson, A. T., Nano Lett. 5, 1774 (2005).Google Scholar
3. Zhou, Y. et al. , Appl. Phys. Lett. 83, 3800 (2003).Google Scholar
4. Polymer Handbook, 4th ed.; John Wiley and Sons: New York, 1999.Google Scholar
5. Datta, S. S., Strachan, D. R., Mele, E. J. and Johnson, A. T., submitted (2007).Google Scholar
6. Heo, J. and Bockrath, M., Nano Lett. 5, 853 (2005).Google Scholar
7. Gekhtman, D. et al. , Phys. Rev. Lett. 82, 3887 (1999).Google Scholar
8. Saito, R. et al. , Appl. Phys. Lett. 60, 2204 (1992).Google Scholar