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Lifetime and Stability of Carbon Cold Cathodes

Published online by Cambridge University Press:  10 February 2011

R. L. Fink
Affiliation:
Field Emission Picture Element Technology, Inc.(FEPET, Inc.), 3006 Longhorn Blvd., Suite 107, Austin, TX 78758, USA
L. H. Thuesen
Affiliation:
Field Emission Picture Element Technology, Inc.(FEPET, Inc.), 3006 Longhorn Blvd., Suite 107, Austin, TX 78758, USA
Z. Li Tolt
Affiliation:
Field Emission Picture Element Technology, Inc.(FEPET, Inc.), 3006 Longhorn Blvd., Suite 107, Austin, TX 78758, USA
Zvi Yaniv
Affiliation:
Field Emission Picture Element Technology, Inc.(FEPET, Inc.), 3006 Longhorn Blvd., Suite 107, Austin, TX 78758, USA
Colleen M. Marrese
Affiliation:
Department of Aerospace Engineering, University of Michigan, 1320 Beal, Ann Arbor, MI 48109, USA
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Abstract

We present the results of tests measuring the life of carbon cold cathodes and determining what conditions limit the life of the cathode. Cathode life and stability are important for a broad range of applications, including displays, electron sources for satellite thrusters, x-ray tubes and microwave devices. Cathodes were tested in vacuum chambers using different gas environments as well as in sealed and gettered glass envelopes. We measured emission current half-lives of 10,000 - 20,000 hours or more in sealed display devices, depending on operating conditions. The presence of a significant oxygen or water partial pressure degrades the life of the cathode. After removing the gases the decay rate was restored to near the original value. A similar partial pressure of hydrogen gas has little or no effect on the life of the cathode. Initial results of operation in a xenon environment indicate carbon cold cathodes are much more robust compared to microtip cathodes. These results will be discussed with respect to the various applications considered for carbon cold cathodes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

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