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Microstructure and Mechanical Properties of CombinatoriallyPrepared Thin Film Aluminum-Silicon Nanocomposites

Published online by Cambridge University Press:  26 February 2011

Charles H. Olk ,
Michael Lukitsch  and
Daad B Haddad
Charles H. Olk
Affiliation:
charles.h.olk@gm.com, General Motors Research and Development, Materials and Processes Lab, MC 480-106-224, 30500 Mound Rd., Warren, MI, 48090-9055, United States, 5869860611, 5869863091
Michael Lukitsch
Affiliation:
Michael.Lukitsch@gm.com, General Motors Research and Developmen, Materials and Processes Lab, MC 480-106-224, 30500 Mound Rd, Warren, MI, 48090-9055, United States
Daad B Haddad
Affiliation:
Daad.Haddad@gm.com, Purdue University, School of Materials Engineering, West Lafayette, IN, 47907, United States
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Abstract

e have undertaken the exploration of the AlxSi1-xsystems to discover new alloys with enhanced properties. We describe themechanical properties of thin film AlxSi1-x alloysdetermined through indentation experiments. Combinatorial methods were usedto systematically control thin film microstructure through variations incomposition and growth temperature. Discrete libraries of compositionallygraded films have been sputter deposited onto silicon substrates to producetwo structural phase regions: amorphous Al-Si and amorphous Si pluscrystalline Al. The mechanical properties of the thin films were determinedby analyzing the load-displacement traces based on the Oliver-Pharr method.X-ray diffraction was used to investigate the microstructures and determinethe crystallite sizes.

Keywords

combinatorial synthesisnanostructureelastic properties

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