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Novel Dielectric Materials for Organic Electronics

Published online by Cambridge University Press:  01 February 2011

Antonio Facchetti ,
Myung-Han Yoon ,
He Yan  and
Tobin J. Marks
Antonio Facchetti
Affiliation:
Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208-3113, USA.
Myung-Han Yoon
Affiliation:
Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208-3113, USA.
He Yan
Affiliation:
Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208-3113, USA.
Tobin J. Marks
Affiliation:
Department of Chemistry and the Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, Illinois 60208-3113, USA.
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Abstract

We present our latest results on the design and fabrication of very high capacitance dielectric materials for organic field-effect transistors. We will show that utilization of appropriate self-assembling siloxane building blocks and polymer matrices allows solution-processed, pinhole-free organic dielectrics. Electrical (MIS, TFT) data demonstrate that these insulators can be efficiently integrated into large TFT structures. These devices function for both p- and n-channel semiconductors, the molecular components of which exhibit greatly different core structures and substituent functionalities. Substantial TFT response is achieved at very low operational biases (<1V), without serious leakage currents (<10-8 A/cm at 1V).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 871: Symposium I – Organic Thin-Film Electronics , 2005 , I6.6
Copyright
Copyright © Materials Research Society 2005

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References

[1] (a) Rogers, J. A., Bao, Z., Katz, H. E., Dodabalapur, A. in Thin-Film Transistors (ed. Kagan, C. R., Andry, P.) 377–425 (Marcel Dekker, Inc., New York, 2003).Google Scholar
(b) Sirringhaus, H.; Tessler, N.; Friend, R. H. Science 280, 1741, (1998).Google Scholar
(c) Chabinyc, M. L., , Salleo, A Chem. Mater. 16, 4509–4521 (2004).Google Scholar
(d) Printed organic and molecular electronic. Gamota, D. R., Brazis, P., Kalyanasundaram, X., Zhang, J. Eds. Kluwer Academic Publishers, New York (2004).Google Scholar
(e) Forrest, S. R. Nature 428, 911–918 (2004).Google Scholar
[2] Mitzi, D. B.; Dimitrakopoulos, C. D.; Kosbar, L. L. Chem. Mater. 13, 3728, (2001).Google Scholar
[3] (a) Dimitrakopoulos, D., Malenfant, P. R. L., Adv. Mater. 14, 99, (2002).Google Scholar
(b) Pappenfus, T. M., Chesterfield, R. J., Frisbie, C., Daniel, M., Kent, R. Casado, J., Raff, J. D., Miller, L. L., J. Am. Chem. Soc. 124, 4184, (2002).Google Scholar
(c) Ong, B. S., Wu, Y., Liu, P. & Gardner, S. J. Am. Chem. Soc. 126, 3378–3379 (2004).Google Scholar
(d) Babel, A., Wind, J. D., Jenekhe, S. A. Adv. Funct. Mater. 14, 891–898 (2004).Google Scholar
(e) Weidkamp, K. P., Afzali, A., Tromp, R. M., Hamers, R. J. A J. Am. Chem. Soc. 126 12740–12741 (2004).Google Scholar
(f) Waldauf, C., Schilinsky, P., Perisutti, M., Hauch, J., Brabec, C. J. Adv. Mater. 15, 2084–2088 (2003).Google Scholar
[4] (a) Yoon, M.-H., DiBenedetto, S., Facchetti, A., Marks, T.J. J. Am. Chem. Soc. 127, 1348–1349 (2005).Google Scholar
(b) Facchetti, A., Yoon, M.-H.; Stern, C. L.; Katz, Marks, H. E., Angew, T. J.. Chem., Int. Ed. 42, 3900, (2003).Google Scholar
(c) Facchetti, A., Mushrush, M., Katz, H. E., Marks, T. J., Adv. Mater. 15, 33, (2003).Google Scholar
(d) Facchetti, A., Deng, Y., Wang, A., Koide, Y., Sirringhaus, H., Marks, T. J., Friend, R. H., Angew. Chem. Int. Ed. 39, 4547, (2000).Google Scholar
[5] Veres, J., Ogier, S., Lloyd, G., de Leeuw, D. Chem. Mater. 16, 4543–4555 (2004).Google Scholar
[6] (a) Knipp, D., Street, R. A., Volkel, A. R. Appl. Phys. Lett. 82, 3907–3909 (2003).Google Scholar
(b) Bao, Z., Rogers, J. A., Katz, H. E. J. Mater. Chem. 1895–1904 (1999).Google Scholar